Fast reconstruction algorithm for structured illumination microscopy

被引：36

作者：

Tu, Shijie ^{[1
]}

Liu, Qiulan ^{[1
]}

Liu, Xin ^{[1
]}

Liu, Wenjie ^{[1
]}

Zhang, Zhimin ^{[1
]}

Luo, Taojin ^{[1
]}

Kuang, Cuifang ^{[1
,2
,3
]}

Liu, Xu ^{[1
,2
,3
]}

Hao, Xiang ^{[1
]}

机构：

[1] Zhejiang Univ, Coll Opt Sci & Engn, State Key Lab Modern Opt Instrumentat, Hangzhou 310027, Peoples R China

[2] Zhejiang Univ, Ningbo Res Inst, Ningbo 315100, Peoples R China

[3] Shanxi Univ, Collaborat Innovat Ctr Extreme Opt, Taiyuan 030006, Peoples R China

来源：

OPTICS LETTERS | 2020年 / 45卷 / 06期

关键词：

RESOLUTION LIMIT; PHASE;

D O I：

10.1364/OL.387888

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Structured illumination microscopy (SIM) is a powerful technique for providing super-resolution imaging, but its reconstruction algorithm, i.e., linear reconstruction structured illumination microscopy (LRSIM) algorithm in the Fourier domain, limits the imaging speed due to its computational effort. Here, we present a novel reconstruction algorithm that can directly process SIM data in the spatial domain. Compared to LRSIM, this approach uses the same number of frames to achieve a comparable resolution but with a much faster processing speed. Our algorithm was verified on both simulated and experimental data using sinusoidal pattern illumination. Moreover, this algorithm is also applicable for speckle pattern illumination. (C) 2020 Optical Society of America

引用

页码：1567 / 1570

页数：4

共 21 条

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