Improved Variance Estimates of FRF Measurements in the Presence of Nonlinear Distortions Via Overlap

被引:4
作者
Barbe, Kurt [1 ]
Pintelon, Rik [1 ]
Schoukens, Johan [1 ]
Lauwers, Lieve [1 ]
机构
[1] Vrije Univ Brussel, Elect Measurement Dept ELEC, B-1050 Brussels, Belgium
关键词
Frequency domain; frequency response function (FRF); measurement noise; nonlinear distortions; Volterra systems; LINEAR-SYSTEMS; IDENTIFICATION;
D O I
10.1109/TIM.2010.2049218
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The frequency response function (FRF) is a common nonparametric modeling tool in many practical engineering problems used for obtaining insight in the device under test. However, the device often behaves nonlinearly. When nonlinearities are detected, the user wants to find out how large these are with respect to the measurement noise. In this paper, we describe a method, based on an overlap technique and periodic excitations, that accurately estimates the FRF, the level of nonlinear distortion, and the measurement noise using only two periods and two random phase realizations of the input signal.
引用
收藏
页码:300 / 309
页数:10
相关论文
共 22 条
[11]  
Mäkilä PM, 2004, AUTOMATICA, V40, P1157, DOI [10.1016/j.automatica.2004.02.008, 10.1016/S0005-1098(04)00060-3]
[12]   INVESTMENT UNDER ALTERNATIVE RETURN ASSUMPTIONS - COMPARING RANDOM-WALKS AND MEAN REVERSION [J].
METCALF, GE ;
HASSETT, KA .
JOURNAL OF ECONOMIC DYNAMICS & CONTROL, 1995, 19 (08) :1471-1488
[13]  
Picinbono Bernard., 1993, RANDOM SIGNALS SYSTE
[14]   Experimental characterization of operational amplifiers: A system identification approach - Part I: Theory and simulations [J].
Pintelon, R ;
Vandersteen, G ;
De Locht, L ;
Rolain, Y ;
Schoukens, J .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2004, 53 (03) :854-862
[15]   Probability density function for frequency response function measurements using periodic signals [J].
Pintelon, R ;
Rolain, Y ;
Van Moer, W .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2003, 52 (01) :61-68
[16]   Measurement and modelling of linear systems in the presence of non-linear distortions [J].
Pintelon, R ;
Schoukens, J .
MECHANICAL SYSTEMS AND SIGNAL PROCESSING, 2002, 16 (05) :785-801
[17]  
Pintelon R., 2001, SYSTEM IDENTIFICATIO
[18]   Continuous-time noise modeling from sampled data [J].
Pintelon, Rik ;
Schoukens, Johan ;
Guillaume, Patrick .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2006, 55 (06) :2253-2258
[19]   Identification of linear systems with nonlinear distortions [J].
Schoukens, J ;
Pintelon, R ;
Dobrowiecki, T ;
Rolain, Y .
AUTOMATICA, 2005, 41 (03) :491-504
[20]   Errors-in-variables methods in system identification [J].
Soderstrom, Torsten .
AUTOMATICA, 2007, 43 (06) :939-958