Phase-Contrast Hard X-ray Microscopy Using Synchrotron Radiation for the Diagnosis of Onychomycosis

被引：12

作者：

Lee, Onseok ^{[2
,3
]}

Ha, Seunghan ^{[4
]}

Lee, Gunwoo ^{[2
,3
]}

Kim, Jaeyoung ^{[2
,3
]}

Huang, Jungyun ^{[5
]}

Jin, Kyeongsik ^{[5
]}

Oh, Chilhwan ^{[1
,2
,3
]}

机构：

[1] Korea Univ, Korea Univ Guro Hosp, Coll Med, Dept Dermatol, Seoul 152703, South Korea

[2] Korea Univ, Med Ctr, Res Inst Skin Image, Seoul 152703, South Korea

[3] Korea Univ, Coll Med, Seoul 136705, South Korea

[4] Univ Pittsburgh, Cardiovasc Inst, Ctr Ultrasound Mol Imaging & Therapeut, Dept Med, Pittsburgh, PA 15260 USA

[5] Pohang Univ Sci & Technol, Pohang Accelerator Lab, Pohang 790784, Gyeongbuk, South Korea

来源：

MICROSCOPY RESEARCH AND TECHNIQUE | 2010年 / 73卷 / 12期

关键词：

phase-contrast X-ray; synchrotron; onychomycosis;

D O I：

10.1002/jemt.20857

中图分类号：

R602 [外科病理学、解剖学]; R32 [人体形态学];

学科分类号：

100101 ;

摘要：

Onychomycosis, or fungal infection of the nail, is a disease seen frequently in clinical settings. However, the rates of positive identification using potassium hydroxide preparations or fungal cultures are relatively low. Precise diagnosis is possible via histopathologic examination to monitor the existence of fungus and performance of a fungal culture for confirmation. Phase-contrast hard X-ray microscopy using synchrotron radiation provides 70-nm spatial resolution and enables imaging of minute internal cellular structures. This study confirms the feasibility of diagnosing onychomycosis using a phase-contrast hard X-ray microscope developed at 1B2 beam line using a Pohang light source. Microsc. Res. Tech. 73:1110-1114, 2010. (C) 2010 Wiley-Liss, Inc.

引用

页码：1110 / 1114

页数：5

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