共 50 条
[21]
Atomic force microscopy. of steep sidewalled feature with carbon nanotube tip
[J].
METROLOGY, INSPECTION, AND PROCESS CONTROL FOR MICROLITHOGRAPHY XVII, PTS 1 AND 2,
2003, 5038
:935-942
[24]
Carbon nanotube transistor fabrication assisted by topographical and conductive atomic force Microscopy
[J].
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS,
2006, 45 (4B)
:3672-3679
[25]
Observation of suspended carbon nanotube configurations using an atomic force microscopy tip
[J].
Jpn. J. Appl. Phys.,
8 Part 1 (0816011-0816015)