In situ splitting of carbon nanotube bundles with atomic force microscopy

被引:10
|
作者
Shen, ZY [1 ]
Liu, SJ
Houl, SM
Gu, ZN
Xue, ZQ
机构
[1] Peking Univ, Dept Elect, Beijing 100871, Peoples R China
[2] Peking Univ, Coll Chem & Mol Engn, Beijing 100871, Peoples R China
关键词
D O I
10.1088/0022-3727/36/17/305
中图分类号
O59 [应用物理学];
学科分类号
摘要
In situ splitting of single-walled carbon nanotube (SWCNT) bundles on the surface of highly oriented pyrolytic graphite was realized using atomic force microscopy (AFM). With an optimal force load of the AFM tip, it was found that the lateral force applied to the nanotube bundle could overcome the adhesive interaction between SWCNTs within the bundle, consequently separating individual nanotubes from the bundle. The threshold of the tip force load for splitting a 'raft' bundle that consists of two SWCNTs was found to be similar to45 nN in our experiments. Our results and analysis show that strong interaction between nanotube bundles and underlying substrate is necessary for the successful splitting of nanotube bundles. This result provides new possibilities for the controllable manipulation of carbon nanotubes.
引用
收藏
页码:2050 / 2053
页数:4
相关论文
共 50 条
  • [11] Fabrication of carbon nanotube diode with atomic force microscopy manipulation
    Jiao, Liying
    Xian, Xiaojun
    Fan, Ben
    Wu, Zhongyun
    Zhang, Jin
    Liu, Zhongfan
    JOURNAL OF PHYSICAL CHEMISTRY C, 2008, 112 (20): : 7544 - 7546
  • [12] Imaging artefacts in atomic force microscopy with carbon nanotube tips
    Strus, MC
    Raman, A
    Han, CS
    Nguyen, CV
    NANOTECHNOLOGY, 2005, 16 (11) : 2482 - 2492
  • [13] Influence of force acting on side face of carbon nanotube in atomic force microscopy
    Akita, Seiji
    Nishijima, Hidehiro
    Kishida, Takayoshi
    Nakayama, Yoshikazu
    Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 2000, 39 (6 B): : 3724 - 3727
  • [14] Influence of force acting on side face of carbon nanotube in atomic force microscopy
    Akita, S
    Nishijima, H
    Kishida, T
    Nakayama, Y
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2000, 39 (6B): : 3724 - 3727
  • [15] In situ atomic force microscopy of electrochemically activated glassy carbon
    Alliata, D
    Häring, P
    Haas, O
    Kötz, R
    Siegenthaler, H
    ELECTROCHEMICAL AND SOLID STATE LETTERS, 1999, 2 (01) : 33 - 35
  • [16] Influence of stiffness of carbon-nanotube probes in atomic force microscopy
    Akita, S
    Nishijima, H
    Nakayama, Y
    JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2000, 33 (21) : 2673 - 2677
  • [17] Atomic force microscopy with carbon nanotube tip for critical dimension measurement
    Park, BC
    Jung, KY
    Song, WY
    O, BH
    Eom, TB
    METROLOGY, INSPECTION, AND PROCESS CONTROL FOR MICROLITHOGRAPHY XVI, PTS 1 & 2, 2002, 4689 : 672 - 679
  • [18] Study on phase images of a carbon nanotube probe in atomic force microscopy
    Fang, F. Z.
    Xu, Z. W.
    Dong, S.
    MEASUREMENT SCIENCE AND TECHNOLOGY, 2008, 19 (05)
  • [19] Study on ringing artefacts of carbon nanotube probes of atomic force microscopy
    Fang, F. (fzfang@gmail.com), 1600, Inderscience Enterprises Ltd., 29, route de Pre-Bois, Case Postale 856, CH-1215 Geneva 15, CH-1215, Switzerland (10):
  • [20] Electric force microscopy of bundles and bundle junctions in carbon nanotube network transparent conductors
    Rowell, Michael W.
    Topinka, Mark A.
    Hellstrom, Sondra
    Bao, Zhenan
    Goldhaber-Gordon, David
    McGehee, Michael D.
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2010, 239