Imaging ellipsometry of graphene

被引：98

作者：

Wurstbauer, Ulrich ^{[1
]}

Roeling, Christian ^{[2
]}

Wurstbauer, Ursula ^{[1
]}

Wegscheider, Werner ^{[1
]}

Vaupel, Matthias ^{[2
]}

Thiesen, Peter H. ^{[2
]}

Weiss, Dieter ^{[1
]}

机构：

[1] Univ Regensburg, Inst Expt & Angew Phys, D-93040 Regensburg, Germany

[2] Accurion GmbH, D-37079 Gottingen, Germany

来源：

APPLIED PHYSICS LETTERS | 2010年 / 97卷 / 23期

关键词：

FILMS;

D O I：

10.1063/1.3524226

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Imaging ellipsometry studies of graphene on SiO2/Si and crystalline GaAs are presented. We demonstrate that imaging ellipsometry is a powerful tool to detect and characterize graphene on any flat substrate. Variable angle spectroscopic ellipsometry is used to explore the dispersion of the optical constants of graphene in the visible range with high lateral resolution. In this way, the influence of the substrate on graphene's optical properties can be investigated. (C) 2010 American Institute of Physics. [doi:10.1063/1.3524226]

引用

页数：3

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