Oxygen isotopic exchange: A useful tool for characterizing oxygen conducting oxides

被引：30
作者：
Bassat, JM
Petitjean, M
Fouletier, J
Lalanne, C
Caboche, G
Mauvy, F
Grenier, JC
机构：
[1] CNRS, ICMCB, F-33608 Pessac, France
[2] Univ Bourgogne, CNRS, LRRS, UMR 5613, F-21078 Dijon, France
[3] INP Grenoble, ENSEEG, LEPMI, F-38402 St Martin Dheres, France
来源：
APPLIED CATALYSIS A-GENERAL | 2005年 / 289卷 / 01期
关键词：
SOFC; mixed conducting oxides; oxygen transport properties; oxygen reduction;
D O I：
10.1016/j.apcata.2005.04.054
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
The (18)O/(16)O isotope exchange depth profile technique (IEDP) followed by SIMS characterizations was applied to dense membranes of pure ionic conductors and mixed ionic/electronic conducting materials. It is a very useful tool since we obtain in both cases data concerning the oxygen diffusion in the bulk and the oxygen exchange at the surface of the materials. Comparisons were done, including results concerning the role of the surface with regards to the oxygen reduction reaction. Detailed experimental and analytical processes are given. (c) 2005 Elsevier B.V. All rights reserved.
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页码：84 / 89
页数：6
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