Low-Cost and Large-Area Hybrid X-Ray Detectors Combining Direct Perovskite Semiconductor and Indirect Scintillator

Both semiconductors and scintillators have their own advantages in direct and indirect X-ray detection, respectively. However, they are also limited by their intrinsic properties and detection mechanisms. Here, a low-cost and large-area flat X-ray detector is reported by combining a cesium silver bismuth bromide (Cs2AgBiBr6) perovskite semiconductor with a ethylenebis-triphenylphosphonium manganese (II) bromide ((C38H34P2)MnBr4) scintillator through fast tableting processes. Cs2AgBiBr6 and (C38H34P2)MnBr4 can attenuate the X-ray photons to induce charge carriers that are collected through the continuous Cs2AgBiBr6 grains. (C38H34P2)MnBr4 blocks the Cs2AgBiBr6 ions migration paths at the grain boundaries to reduce the device dark current/noise and improves the working stability. Most charges generated by (C38H34P2)MnBr4 are transferred to the adjacent Cs2AgBiBr6, and recombined charges radiate light through scintillation, which will be further absorbed by the surrounding Cs2AgBiBr6 perovskite, and further induce collectable charges for indirect X-ray detection, avoiding the unwanted light scattering, self-absorption, or afterglow effects of scintillators. The hybrid X-ray detector displays a high sensitivity of 114 mu C Gy(air)(-1) cm(-2) to 120 keV(p) hard X-rays with a lowest detectable dose rate of 0.2 mu Gy(air) s(-1), showing 75 times lower detection limit compared to (C38H34P2)MnBr4 scintillator, which provides a new path for X-ray flat-panel design.