Finite Element Simulation Of Laser-Induced Diffusion In Silicon

被引:11
作者
Poulain, G. [1 ]
Blanc, D. [1 ]
Pellegrin, Y. [2 ]
Lemitia, M. [1 ]
机构
[1] Univ Lyon, Inst Nanotechnol Lyon INL UMR5270, CNRS, INSA Lyon, F-69621 Villeurbanne, France
[2] SEMCO Eng, F-34196 Montpellier 5, France
来源
PROCEEDINGS OF THE SILICONPV 2011 CONFERENCE (1ST INTERNATIONAL CONFERENCE ON CRYSTALLINE SILICON PHOTOVOLTAICS) | 2011年 / 8卷
关键词
Laser doping; silicon solar cell; phosphorus; finite element; dopant diffusion; selective emitter;
D O I
10.1016/j.egypro.2011.06.187
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
Laser-assisted diffusion of dopants is a promising way to realize selective emitter solar cells with a reduced number of technological steps. This paper discusses the simulation by finite element method of laser doping in order to optimise the fabrication process. A finite element method is used to solve the heat-transfer equation which describes the thermal effects and Fick's second law which describes the diffusion of dopants. The phosphosilicate glass (PSG) layer that is produced during the emitter formation on p-type silicon solar cells is used as the doping source during the laser-assisted diffusion process. The influence of laser parameters and material properties are studied. Modelling results are compared to SIMS measurements of the phosphorous doping profile. A structure is discussed in the perspective of a self-aligned process for selective emitter fabrication, where the PSG layer is present underneath the silicon nitride (SiNx) passivation layer. (C) 2011 Published by Elsevier Ltd. Selection and/or peer-review under responsibility of SiliconPV 2011.
引用
收藏
页码:587 / 591
页数:5
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