Nanolithography with the scanning probe microscope

被引:0
作者
Chigir, GG
Emelyanov, VA
Ponomar, VN
Ukhov, VA
Sergeev, OV
Borisenko, VE
机构
[1] INTEGRAL Sci Ind Enterprise, Minsk 220064, BELARUS
[2] Belarussian State Univ Informat & Radioelect, Minsk, BELARUS
来源
PHYSICS OF LOW-DIMENSIONAL STRUCTURES | 2001年 / 3-4卷
关键词
D O I
暂无
中图分类号
O59 [应用物理学];
学科分类号
摘要
Brief results of thin resist layer fabrication and following exposition under probe-emitted electrons by means of "Nanodesigner" system are demonstrated.
引用
收藏
页码:327 / 332
页数:6
相关论文
共 1 条
[1]   Nanometer scale lithography on silicon, titanium and PMMA resist using scanning probe microscopy [J].
Dubois, E ;
Bubbendorff, JL .
SOLID-STATE ELECTRONICS, 1999, 43 (06) :1085-1089