Ferroelectric domain in PNM-xPT single crystal studied by piezoresponse force microscopy and finite element analysis

被引：1
作者：
Wong, K. S. [1 ]
Wang, B. [1 ,2 ]
Dai, J. Y. [1 ]
Luo, H. S. [3 ]
机构：
[1] Hong Kong Polytech Univ, Dept Appl Phys, Hong Kong, Hong Kong, Peoples R China
[2] Zhejiang Univ, Coll Elect Engn, Hangzhou 310027, Peoples R China
[3] Chinese Acad Sci, Shanghai Inst Ceram, State Key Lab High Performance Ceram & Superfine, Shanghai 201800, Peoples R China
来源：
2007 SIXTEENTH IEEE INTERNATIONAL SYMPOSIUM ON THE APPLICATIONS OF FERROELECTRICS, VOLS 1 AND 2 | 2007年
关键词：
D O I：
10.1109/ISAF.2007.4393263
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Ferroelectric domain structures in (001)cut (Pb(Mg1/3Nb2/3)O-3)(0.62)(PbTiO3)(0.38) and (011)-cut (Pb(Mg1/3Nb2/3)O-3)(0.4)(PbTiO3)(0.6) single crystals have been studied by means of piezoresponse force microscopy. The out-of-plane and in-plane domain image reveal the domain pattern in the crystal. Finite element analysis is carried out to interpreate the superposition domain structure and its corresponing domain imaging.
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页码：353 / +
页数：3
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