Hard X-ray phase imaging and tomography using a grating interferometer

被引:34
作者
David, C. [1 ]
Weitkamp, T.
Pfeiffer, F.
Diaz, A.
Bruder, J.
Rohbeck, T.
Groso, A.
Bunk, O.
Stampanoni, M.
Cloetens, P.
机构
[1] Paul Scherrer Inst, Villigen, Switzerland
[2] European Synchrotron Radiat Facil, F-38043 Grenoble, France
关键词
synchrotron radiation; phase contrast; radiography; interferometry;
D O I
10.1016/j.sab.2007.03.001
中图分类号
O433 [光谱学];
学科分类号
0703 ; 070302 ;
摘要
An interferometric technique for hard X-rays is presented. It is based on two transmission gratings and a phase-stepping technique, and it provides separate radiographs of the phase and absorption profiles of bulk samples. Tomographic reconstruction yields quantitative threedimensional maps of the X-ray refractive index and of the attenuation coefficient, with a spatial resolution down to a few microns. The method is mechanically robust, it requires little monochromaticity, and can be scaled up to large fields of view. These are important prerequisites for use with laboratory X-ray sources. Numerous applications ranging from wave front sensing to medical radiography are presently under investigation. (c) 2007 Elsevier B.V All rights reserved.
引用
收藏
页码:626 / 630
页数:5
相关论文
共 16 条
[1]  
Ando M, 1972, P 6 INT C XRAY OPTIC, P63
[2]   Three-dimensional imaging of nerve tissue by x-ray phase-contrast microtomography [J].
Beckmann, F ;
Heise, K ;
Kölsch, B ;
Bonse, U ;
Rajewsky, MF ;
Bartscher, M ;
Biermann, T .
BIOPHYSICAL JOURNAL, 1999, 76 (01) :98-102
[3]   AN X-RAY INTERFEROMETER [J].
BONSE, U ;
HART, M .
APPLIED PHYSICS LETTERS, 1965, 6 (08) :155-&
[4]   Observation of microstructure and damage in materials by phase sensitive radiography and tomography [J].
Cloetens, P ;
PateyronSalome, M ;
Buffiere, JY ;
Peix, G ;
Baruchel, J ;
Peyrin, F ;
Schlenker, M .
JOURNAL OF APPLIED PHYSICS, 1997, 81 (09) :5878-5886
[5]   Hard x-ray phase imaging using simple propagation of a coherent synchrotron radiation beam [J].
Cloetens, P ;
Ludwig, W ;
Baruchel, J ;
Guigay, JP ;
Pernot-Rejmánková, P ;
Salomé-Pateyron, M ;
Schlenker, M ;
Buffière, JY ;
Maire, E ;
Peix, G .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1999, 32 (10A) :A145-A151
[6]  
Creath K., 1988, Progress in optics. Vol.XXVI, P349, DOI 10.1016/S0079-6638(08)70178-1
[7]   Line width control using a defocused low voltage electron beam [J].
David, C ;
Hambach, D .
MICROELECTRONIC ENGINEERING, 1999, 46 (1-4) :219-222
[8]   Differential x-ray phase contrast imaging using a shearing interferometer [J].
David, C ;
Nöhammer, B ;
Solak, HH ;
Ziegler, E .
APPLIED PHYSICS LETTERS, 2002, 81 (17) :3287-3289
[9]   Wet-etched diffractive lenses for hard X-rays [J].
David, C ;
Ziegler, E ;
Nöhammer, B .
JOURNAL OF SYNCHROTRON RADIATION, 2001, 8 (03) :1054-1055
[10]  
DAVID C, 2007, IN PRESS MICROELECTR