Is precession electron diffraction kinematical? Part II A practical method to determine the optimum precession angle

被引:27
作者
Eggeman, A. S. [1 ]
White, T. A. [1 ]
Midgley, P. A. [1 ]
机构
[1] Univ Cambridge, Dept Mat Sci & Met, Cambridge CB2 3QZ, England
基金
英国工程与自然科学研究理事会;
关键词
Precession electron diffraction; Phase retrieval; CRYSTAL-STRUCTURE;
D O I
10.1016/j.ultramic.2009.10.012
中图分类号
TH742 [显微镜];
学科分类号
摘要
A series of experiments was undertaken to investigate the kinematical nature of precession electron diffraction data and to gauge the optimum precession angle for a particular system. Kinematically forbidden reflections in silicon were used to show how a large precession angle is needed to minimise multi-beam conditions for specific reflections and so reduce the contribution from dynamical diffraction. Small precession angles were shown to be detrimental to the kinematical nature of some low-order reflections. By varying precession angles, precession electron diffraction data for erbium pyrogermanate were used to investigate the effect of dynamical diffraction on the output from structure solution algorithms. A good correlation was noted between the precession angle at which the rate of change of relative intensities is small and the angle at which the recovered structure factor phases matched the theoretical kinematical structure factor phases. (C) 2009 Elsevier B.V. All rights reserved.
引用
收藏
页码:771 / 777
页数:7
相关论文
共 16 条
[1]   A quantitative analysis of the cone-angle dependence in precession electron diffraction [J].
Ciston, J. ;
Deng, B. ;
Marks, L. D. ;
Own, C. S. ;
Sinkler, W. .
ULTRAMICROSCOPY, 2008, 108 (06) :514-522
[2]   Crystal structure refinement using Bloch-wave method for precession electron diffraction [J].
Dudka, A. P. ;
Avilov, A. S. ;
Nicolopoulos, S. .
ULTRAMICROSCOPY, 2007, 107 (6-7) :474-482
[3]   Symmetry-modified charge flipping [J].
Eggeman, Alexander ;
White, Thomas ;
Midgley, Paul .
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2009, 65 :120-127
[4]   Phase retrieval by iterated projections [J].
Elser, V .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 2003, 20 (01) :40-55
[5]   STRUCTURE-FACTOR RELATIONS AND PHASE DETERMINATION [J].
GILLIS, J .
ACTA CRYSTALLOGRAPHICA, 1948, 1 (1-6) :76-80
[6]   EXTINCTION CONDITIONS IN DYNAMIC THEORY OF ELECTRON DIFFRACTION [J].
GJONNES, J ;
MOODIE, AF .
ACTA CRYSTALLOGRAPHICA, 1965, 19 :65-&
[7]   PHASES OF FOURIER COEFFICIENTS DIRECTLY FROM CRYSTAL DIFFRACTION DATA [J].
HARKER, D ;
KASPER, JS .
ACTA CRYSTALLOGRAPHICA, 1948, 1 (1-6) :70-75
[8]   MSLS, a least-squares procedure for accurate crystal structure refinement from dynamical electron diffraction patterns [J].
Jansen, J ;
Tang, D ;
Zandbergen, HW ;
Schenk, H .
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 1998, 54 :91-101
[9]  
Kirkland E., 1998, Advanced computing in Electron Microscopy
[10]   LACDIF, a new electron diffraction technique obtained with the LACBED configuration and a Cs corrector:: Comparison with electron precession [J].
Morniroli, J. P. ;
Houdellier, F. ;
Roucau, C. ;
Puiggali, J. ;
Gesti, S. ;
Redjaimia, A. .
ULTRAMICROSCOPY, 2008, 108 (02) :100-115