共 50 条
- [31] Fault Detection and Redundancy Design for TSVs in 3D ICs PROCEEDINGS OF 2015 IEEE 11TH INTERNATIONAL CONFERENCE ON ASIC (ASICON), 2015,
- [32] Built-In Self-Repair for Manufacturing and Runtime TSV Defects in 3D ICs 2020 IEEE INTERNATIONAL TEST CONFERENCE INDIA (ITC INDIA), 2020, : 40 - 45
- [34] NodeRank: Observation-Point Insertion for Fault Localization in Monolithic 3D ICs 2020 IEEE 29TH ASIAN TEST SYMPOSIUM (ATS), 2020, : 168 - 173
- [37] Investigation of the Dynamics of Liquid Cooling of 3D ICs 2019 8TH INTERNATIONAL SYMPOSIUM ON NEXT GENERATION ELECTRONICS (ISNE), 2019,
- [38] A Comprehensive Platform for Thermal Studies in TSV-based 3D Integrated Circuits 2014 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM), 2014,
- [39] Metal Film Bridge with TSV-based 3D Wafer Level Packaging 2015 IEEE 10TH INTERNATIONAL CONFERENCE ON NANO/MICRO ENGINEERED AND MOLECULAR SYSTEMS (NEMS), 2015, : 430 - 434
- [40] Structural Optimization of Ground Vias for 3D ICs MANUFACTURING PROCESS TECHNOLOGY, PTS 1-5, 2011, 189-193 : 1472 - 1475