Proton-Induced SDRAM Cell Degradation

被引：0

作者：

Rodriguez, A. ^{[1
]}

Wrobel, F. ^{[1
,2
]}

Samaras, A. ^{[3
]}

Bezerra, F. ^{[4
]}

Vandevelde, B. ^{[3
]}

Ecoffet, R. ^{[4
]}

Touboul, A. ^{[1
]}

Chatry, N. ^{[3
]}

Dilillo, L. ^{[5
]}

Saigne, F. ^{[1
]}

机构：

[1] Univ Montpellier, IES UMR UM CNRS 5214, 860 Rue St Priest,Bat 5, F-34097 Montpellier, France

[2] Inst Univ France, Paris, France

[3] TRAD, F-31670 Labege, France

[4] Ctr Natl Etud Spatiales, F-31400 Toulouse, France

[5] Univ Montpellier, LIRMM, CNRS, F-34095 Montpellier 5, France

来源：

2015 15TH EUROPEAN CONFERENCE ON RADIATION AND ITS EFFECTS ON COMPONENTS AND SYSTEMS (RADECS) | 2015年

关键词：

SDRAM; proton; retention time degradation; BULK DAMAGE;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Retention time degradation and cell functionality under proton irradiation is studied for two SDRAM references that exhibit in-flight faulty behavior. Elements that may be used for physical interpretation of the phenomenon are given.

引用

页数：4

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