Synthesis of Doped, Ternary, and Quaternary Materials by Atomic Layer Deposition: A Review

被引:215
作者
Mackus, Adriaan J. M. [1 ,2 ]
Schneider, Joel R. [1 ]
MacIsaac, Callisto [3 ]
Baker, Jon G. [1 ]
Bent, Stacey F. [1 ]
机构
[1] Stanford Univ, Dept Chem Engn, Stanford, CA 94305 USA
[2] Eindhoven Univ Technol, Dept Appl Phys, POB 513, NL-5600 MB Eindhoven, Netherlands
[3] Stanford Univ, Dept Chem, Stanford, CA 94305 USA
基金
美国国家科学基金会;
关键词
OXIDE THIN-FILMS; CHEMICAL-VAPOR-DEPOSITION; YTTRIA-STABILIZED ZIRCONIA; SOLID-STATE ELECTROLYTES; LIQUID INJECTION ALD; ELECTRICAL-PROPERTIES; ZNO FILMS; LOW-TEMPERATURE; CONTROLLED GROWTH; DIFFUSION BARRIER;
D O I
10.1021/acs.chemmater.8b02878
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
In the past decade, atomic layer deposition (ALD) has become an important thin film deposition technique for applications in nanoelectronics, catalysis, and other areas due to its high conformality on 3-D nanostructured substrates and control of the film thickness at the atomic level. The current applications of ALD primarily involve binary metal oxides, but for new applications there is increasing interest in more complex materials such as doped, ternary, and quaternary materials. This article reviews how these multicomponent materials can be synthesized by ALD, gives an overview of the materials that have been reported in the literature to date, and discusses important challenges. The most commonly employed approach to synthesize these materials is to combine binary ALD cycles in a supercycle, which provides the ability to control the composition of the material by choosing the cycle ratio. Discussion will focus on four main topics: (i) the characteristics, benefits, and drawbacks of the approaches that currently exist for the synthesis of multicomponent materials, with special attention to the supercycle approach; (ii) the trends in precursor choice, process conditions, and characterization methods, as well as underlying motivations for these design decisions; (iii) the distribution of atoms in the deposited material and the formation of specific (crystalline) phases, which is shown to be dependent on the ALD cycle sequence, deposition temperature, and post-deposition anneal conditions; and (iv) the nucleation effects that occur when switching from one binary ALD process to another, with different explanations provided for why the growth characteristics often deviate from what is expected. This paper provides insight into how the deposition conditions (cycle sequence, temperature, etc.) affect the properties of the resultant thin films, which can serve as a guideline for designing new ALD processes. Furthermore, with an extensive discussion on the nucleation effects taking place during the growth of ternary materials, we hope to contribute to a better understanding of the underlying mechanisms of the ALD growth of multicomponent materials.
引用
收藏
页码:1142 / 1183
页数:42
相关论文
共 501 条
  • [1] Atomic Layer Deposition of Li2O-Al2O3 Thin Films
    Aaltonen, Titta
    Nilsen, Ola
    Magraso, Anna
    Fjellvag, Helmer
    [J]. CHEMISTRY OF MATERIALS, 2011, 23 (21) : 4669 - 4675
  • [2] Lanthanum titanate and lithium lanthanum titanate thin films grown by atomic layer deposition
    Aaltonen, Titta
    Alnes, Mari
    Nilsen, Ola
    Costelle, Leila
    Fjellvag, Helmer
    [J]. JOURNAL OF MATERIALS CHEMISTRY, 2010, 20 (14) : 2877 - 2881
  • [3] Atomic Laver Deposited Lanthanum-(Zirconate/Aluminate) Based High-K Dielectric Stacks For Future CMOS-Technology
    Abermann, S.
    Henkel, C.
    Bethge, O.
    Bertagnolli, E.
    [J]. PHYSICS AND TECHNOLOGY OF HIGH-K GATE DIELECTRICS 6, 2008, 16 (05): : 273 - 283
  • [4] Self-limiting atomic layer deposition of barium oxide and barium titanate thin films using a novel pyrrole based precursor
    Acharya, Shinjita
    Torgersen, Jan
    Kim, Yongmin
    Park, Joonsuk
    Schindler, Peter
    Dadlani, Anup L.
    Winterkorn, Martin
    Xu, Shicheng
    Walch, Stephen P.
    Usui, Takane
    Schildknecht, Christian
    Prinz, Fritz B.
    [J]. JOURNAL OF MATERIALS CHEMISTRY C, 2016, 4 (10) : 1945 - 1952
  • [5] Atomic-layer-deposited tantalum silicate as a gate dielectric for III-V MOS devices
    Adelmann, C.
    Lin, D.
    Nyns, L.
    Schepers, B.
    Delabie, A.
    Van Elshocht, S.
    Caymax, M.
    [J]. MICROELECTRONIC ENGINEERING, 2011, 88 (07) : 1098 - 1100
  • [6] Atomic Layer Deposition of Gd-Doped HfO2 Thin Films
    Adelmann, C.
    Tielens, H.
    Dewulf, D.
    Hardy, A.
    Pierreux, D.
    Swerts, J.
    Rosseel, E.
    Shi, X.
    Van Bael, M. K.
    Kittl, J. A.
    Van Elshocht, S.
    [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 2010, 157 (04) : G105 - G110
  • [7] Atomic Layer Deposition of Gadolinium Aluminate using Gd(iPrCp)3, TMA, and O3 or H2O
    Adelmann, Christoph
    Pierreux, Dieter
    Swerts, Johan
    Dewulf, Dann
    Hardy, An
    Tielens, Hilde
    Franquet, Alexis
    Brijs, Bert
    Moussa, Alain
    Conard, Thierry
    Van Bael, Marlies K.
    Maes, Jan W.
    Jurczak, Malgorzata
    Kittl, Jorge A.
    Van Elshocht, Sven
    [J]. CHEMICAL VAPOR DEPOSITION, 2010, 16 (4-6) : 170 - 178
  • [8] High frequency reciprocating sliding wear behavior and mechanisms of quaternary metal oxide coatings
    Ageh, V.
    Choudhuri, D.
    Scharf, T. W.
    [J]. WEAR, 2015, 330 : 390 - 399
  • [9] Processing-structure-tribological property interrelationships of zinc titanate coatings grown by atomic layer deposition
    Ageh, V.
    Mohseni, H.
    Scharf, T. W.
    [J]. SURFACE & COATINGS TECHNOLOGY, 2014, 241 : 112 - 117
  • [10] Influence of growth temperature on the electrical and structural characteristics of conductive Al-doped ZnO thin films grown by atomic layer deposition
    Ahn, Cheol Hyoun
    Lee, Sang Yeol
    Cho, Hyung Koun
    [J]. THIN SOLID FILMS, 2013, 545 : 106 - 110