Photocatalytic effect of thermal atomic layer deposition of TiO2 on stainless steel

被引:37
作者
Kang, Hyemin [1 ]
Lee, Chang-Soo [2 ]
Kim, Do-Young [1 ]
Kim, Jungwon [3 ]
Choi, Wonyong [3 ]
Kim, Hyungjun [1 ]
机构
[1] Yonsei Univ, Sch Elect & Elect Engn, Seoul 120749, South Korea
[2] Pohang Univ Sci & Technol POSTECH, Dept Mat Sci & Engn, Pohang 790784, South Korea
[3] Pohang Univ Sci & Technol POSTECH, Sch Environm Sci & Engn, Pohang 790784, South Korea
关键词
Atomic layer deposition; Photocatalyst; TiO2; PLASMA-ENHANCED ALD; THIN-FILMS; THICKNESS; CVD; SUBSTRATE; COATINGS; SURFACES;
D O I
10.1016/j.apcatb.2011.03.010
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The thermal atomic layer deposition (Th-ALD) of TiO2 films on stainless steel for use as a photocatalyst was investigated and compared to plasma-enhanced ALD (PE-ALD) using the same precursor. Th-ALD TiO2 films were deposited on stainless steel using a Ti(NMe2)(4) [tetrakis(dimethylamido)Ti,TDMAT] precursor. The microstructure of the Th-ALD TiO2 films was greatly dependent on the growth temperature as an amorphous structure was obtained at 200 degrees C and a polycrystalline structure was achieved at temperatures above 300 degrees C. From the contact angle measurement of water, the crystalline TiO2 films exhibited super-hydrophilicity after UV irradiation. The anatase phase of both the Th- and PE-ALD TiO2 films grown on stainless steel showed higher photocatalytic abilities than the rutile phase grown at 400 degrees C. In addition, the anatase PE-ALD TiO2 film demonstrated a higher photocatalytic efficiency than the Th-ALD films. The photocatalytic efficiency of the Th-ALD TiO2 films was investigated as a function of film thickness and it was found that the efficiency was saturated above a film thickness of 120 nm. (C) 2011 Elsevier B.V. All rights reserved.
引用
收藏
页码:6 / 11
页数:6
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