Temperature characterization of dielectric-resonator materials

被引：34

作者：

Kajfez, D ^{[1
]}

机构：

[1] Univ Mississippi, Dept Elect Engn, University, MS 38677 USA

来源：

JOURNAL OF THE EUROPEAN CERAMIC SOCIETY | 2001年 / 21卷 / 15期

关键词：

electromagnetic fields; microwave dielectric properties; microwave resonators; temperature;

D O I：

10.1016/S0955-2219(01)00341-7

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Dielectric resonators are widely used as components of microwave resonant cavities with extremely high Q factors. To design a temperature-compensated resonator it is necessary to know accurately the value of tau (epsilon) the temperature coefficient of the dielectric constant. A simple and accurate procedure is described to measure this quantity. Furthermore, the paper discusses uncertainties involved in the use of another quantity. tau (f), which is nowadays supplied by the manufacturers of dielectric resonators to characterize the temperature variation of dielectric resonators. (C) 2001 Elsevier Science Ltd. All rights reserved.

引用

页码：2663 / 2667

页数：5

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