Note: Advancement in tip etching for preparation of tunable size scanning tunneling microscopy tips

被引：3

作者：

Corbett, J. P. ^{[1
]}

Pandya, S. G. ^{[1
]}

Mandru, A. -O. ^{[1
]}

Pak, J. ^{[1
]}

Kordesch, M. E. ^{[1
]}

Smith, A. R. ^{[1
]}

机构：

[1] Ohio Univ, Dept Phys & Astron, Nanoscale & Quantum Phenomena Inst, Athens, OH 45701 USA

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2015年 / 86卷 / 02期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1063/1.4907706

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The two aspects of a scanning tunneling microscopy tip, the macroscopic profile and the nanoscale apex, can be tailored by controlling the tension during electrochemical etching and the solution-electrode contact area via acetone vapor. The apex diameter is shown to be proportional to the square root of the tension, and is demonstrated over apex diameters of 150-500 nm. The apex was found to be created in four distinct shapes where a secondary etching can reshape the tip into a single geometry. Improvement in tip height and stability of the profile are demonstrated versus a non-acetone fabrication control. (C) 2015 AIP Publishing LLC.

引用

页数：3