Effects of stirring on the bulk etch rate of CR-39 detector

被引：48

作者：

Ho, JPY ^{[1
]}

Yip, CWY ^{[1
]}

Nikezic, D ^{[1
]}

Yu, KN ^{[1
]}

机构：

[1] City Univ Hong Kong, Dept Phys & Mat Sci, Kowloon, Hong Kong, Peoples R China

来源：

RADIATION MEASUREMENTS | 2003年 / 36卷 / 1-6期

关键词：

CR-39; bulk etch rate; stirring;

D O I：

10.1016/S1350-4487(03)00111-2

中图分类号：

TL [原子能技术]; O571 [原子核物理学];

学科分类号：

0827 ; 082701 ;

摘要：

It is well established that the bulk etch rates for solid state nuclear track detectors are affected by the concentration and the temperature of the etchant. Recently, we found that the bulk etch rate for the LR 115 detector to be affected by stirring during etching. In the present work, the effects of stirring on the bulk etch rate of the CR-39 detector is investigated. One set of sample was etched under continuous stirring by a magnetic stirrer at 70degreesC in a 6.25 N NaOH solution, while the other set of samples was etched without the magnetic stirrer. After etching, the bulk etch thickness was measured using Form Talysurf PGI (Taylor Hobson, Leicester, England). It was found that magnetic stirring did not affect the bulk etch of the CR-39 detector, which was in contrast to the results for the LR 115 detector. (C) 2003 Elsevier Ltd. All rights reserved.

引用

页码：141 / 143

页数：3

共 4 条

[1]

Durrani S. A., 1987, Solid State Nuclear Track Detection: Principles, Methods and Applications

[2] Bulk etching rate of LR115 detectors [J].

Nikezic, D ;

Janicijevic, A .

APPLIED RADIATION AND ISOTOPES, 2002, 57 (02) :275-278

[3] Measurement of bulk etch rate of CR-39 with atomic force microscopy [J].

Yasuda, N ;

Yamamoto, M ;

Miyahara, N ;

Ishigure, N ;

Kanai, T ;

Ogura, K .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1998, 142 (1-2) :111-116

[4] Effects of stirring on the bulk etch rate of LR 115 detector [J].

Yip, CWY ;

Ho, JPY ;

Koo, VSY ;

Nikezic, D ;

Yu, KN .

RADIATION MEASUREMENTS, 2003, 37 (03) :197-200

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