Cation order determination in Cu-based quaternary chalcogenide semiconductors by Multiple Edge Anomalous Diffraction

被引：0
|
作者：
Toebbens, D. M. [1 ]
Schorr, S. [1 ]
机构：
[1] Helmholtz Zentrum Berlin, Berlin, Germany
来源：
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 2022年 / 78卷
关键词：
D O I：
10.1107/S2053273322095833
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
MS14-05
引用
收藏
页码：E98 / E99
页数：2
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