Etching mask effect of the nanoscratched borosilicate surface and its application to maskless pattern fabrication

被引:1
作者
Youn, SW [1 ]
Kang, CG
机构
[1] Pusan Natl Univ, Dept Precis & Mech Engn, Pusan 609735, South Korea
[2] Pusan Natl Univ, Sch Mech Engn, Pusan 609735, South Korea
来源
PRICM 5: THE FIFTH PACIFIC RIM INTERNATIONAL CONFERENCE ON ADVANCED MATERIALS AND PROCESSING, PTS 1-5 | 2005年 / 475-479卷
关键词
nanoscratch; etch-mask effect; HF wet etching; Hyper-fine pattern;
D O I
10.4028/www.scientific.net/MSF.475-479.3479
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The purpose of this study is to suggest a maskless pattern fabrication technique using the combination of machining by Nanoindenter (R) XP and HF wet etching. Sample line patterns were machined on a borosilicate surface by constant load scratch (CLS) of the nanoindenter with a Berkovich diamond tip, and they were etched in HF solution to investigate chemical characteristics of the machined borosilicate surface. After the etching process, the convex structure was made. On the basis of this fact, some line patterns with convex structures were fabricated.
引用
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页码:3479 / 3482
页数:4
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