Statistical methods to compare the texture features of machined surfaces

被引:76
作者
Ramana, KV
Ramamoorthy, B
机构
[1] Manufacturing Engineering Section, Department of Mechanical Engineering, Indian Institute of Technology
关键词
textures; machined surfaces; co-occurrence; run length; AVRM;
D O I
10.1016/0031-3203(96)00008-8
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
Texture studies play a paramount role in many image processing applications. In this paper an attempt is made to study the textural features of machined surfaces (grinding, milling and shaping) using the most widely used statistical methods, viz, co-occurrence matrix approach, the amplitude varying rate statistical approach (AVRS) and the run length matrix approach. Textural features derived from these matrices are studied and analysed. A new matrix for the qualitative evaluation of surfaces, namely the gray-level difference-pixel distance matrix, is presented and its usefulness in texture analysis is analysed. The features calculated from these matrices are correlated with surface parameters, such as roughness, and the different features are studied for classification of these surfaces. Copyright (C) 1996 Pattern Recognition Society. Published by Elsevier Science Ltd.
引用
收藏
页码:1447 / 1459
页数:13
相关论文
共 11 条
  • [1] AMASDASUN M, 1989, IEEE T SYST MAN CYB, V19, P1264
  • [2] USE OF GRAY VALUE DISTRIBUTION OF RUN LENGTHS FOR TEXTURE ANALYSIS
    CHU, A
    SEHGAL, CM
    GREENLEAF, JF
    [J]. PATTERN RECOGNITION LETTERS, 1990, 11 (06) : 415 - 419
  • [3] Galloway M. M., 1975, COMPUTER GRAPHICS IM, V4, P172, DOI [DOI 10.1016/S0146-664X(75)80008-6, 10.1016/S0146-664X(75)80008-6]
  • [4] STATISTICAL AND STRUCTURAL APPROACHES TO TEXTURE
    HARALICK, RM
    [J]. PROCEEDINGS OF THE IEEE, 1979, 67 (05) : 786 - 804
  • [5] TEXTURAL FEATURES FOR IMAGE CLASSIFICATION
    HARALICK, RM
    SHANMUGAM, K
    DINSTEIN, I
    [J]. IEEE TRANSACTIONS ON SYSTEMS MAN AND CYBERNETICS, 1973, SMC3 (06): : 610 - 621
  • [6] TEXTURE-DISCRIMINATION BASED ON AN OPTIMAL UTILIZATION OF TEXTURE FEATURES
    HE, DC
    WANG, L
    GUIBERT, J
    [J]. PATTERN RECOGNITION, 1988, 21 (02) : 141 - 146
  • [7] UNSER M, 1986, IEEE T PATTERN ANAL, V8, P336
  • [8] TEXTURE ANALYSIS ANNO 1983
    VANGOOL, L
    DEWAELE, P
    OOSTERLINCK, A
    [J]. COMPUTER VISION GRAPHICS AND IMAGE PROCESSING, 1985, 29 (03): : 336 - 357
  • [9] WESKA JS, 1976, IEEE T SYST MAN CYB, V6, P269
  • [10] APPLICATION OF TEXTURE ANALYSIS TO MATERIALS INSPECTION
    WESZKA, JS
    ROSENFELD, A
    [J]. PATTERN RECOGNITION, 1976, 8 (04) : 195 - 200