A study on electrical properties of Au/4H-SiC Schottky diode under illumination

被引:10
|
作者
Yildiz, D. E. [1 ]
Karadeniz, S. [2 ]
Gullu, H. H. [3 ,4 ]
机构
[1] Hitit Univ, Fac Arts & Sci, Dept Phys, TR-79030 Corum, Turkey
[2] Giresun Univ, Fac Engn, Energy Syst Engn, TR-28200 Giresun, Turkey
[3] ASELSAN Inc, Microelect Guidance & Electroopt Div, Opt & Optomech Design Dept, TR-06200 Ankara, Turkey
[4] Atilim Univ, Fac Engn, Dept Elect & Elect Engn, TR-06836 Ankara, Turkey
关键词
BARRIER HEIGHT DETERMINATION; PHOTOELECTRICAL CHARACTERIZATION; TRANSPORT MECHANISM; POOLE-FRENKEL; THIN-FILMS; TEMPERATURE; INTENSITY; CONDUCTIVITY; PARAMETERS; ALUMINUM;
D O I
10.1007/s10854-021-06480-7
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Y In this work, a metal-semiconductor diode in the form of Au/4H-SiC is fabricated, and the electrical properties of this device are systematically examined under dark and different illumination intensities. To perform this, the currentvoltage (I-V) characteristics of the Schottky-type diode are analyzed at room temperature. The performance parameters such as saturation current (I-0), barrier height (Phi(B)), ideality factor (n) and series resistance (R-s) are found to be illumination dependent. The reverse biased I - V characteristics under incident light indicate high photo-sensitivity as compared to the response at forward bias. Thus, this result is investigated in detail according to both Schottky and Poole-Frenkel effects. It is found that the Poole-Frenkel mechanism is dominant in the reverse biased region. The Au/4H-SiC Schottky junction has a strong photo-current response to the different illumination intensities and transient photocurrent characteristics of the fabricated device are studied at the illumination intensities of 50 and 100 mW/cm(2). All experimental results indicate that the Au/4H-SiC Schottky diode, with a valuable response to the illumination together with change in illumination intensity, can be used for optoelectronic applications.
引用
收藏
页码:20130 / 20138
页数:9
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