Hard X-ray photoelectron and X-ray absorption spectroscopy characterization of oxidized surfaces of iron sulfides

被引:27
|
作者
Mikhlin, Yuri [1 ]
Tomashevich, Yevgeny [1 ]
Vorobyev, Sergey [1 ,2 ]
Saikova, Svetlana [2 ]
Romanchenko, Alexander [1 ]
Felix, Roberto [3 ]
机构
[1] Russian Acad Sci, Siberian Branch, Inst Chem & Chem Technol, Akademgorodok 50-24, Krasnoyarsk 660036, Russia
[2] Siberian Fed Univ, Svobodny Pr 79, Krasnoyarsk 660041, Russia
[3] Helmholtz Zentrum Berlin Mat & Energie GmbH, Renewable Energy, Lise Meitner Campus,Hahn Meitner Pl 1, D-14109 Berlin, Germany
基金
俄罗斯科学基金会;
关键词
HAXPES; XANES; Pyrite; Pyrrhotite; Oxidation; Undersurface; ANGULAR-DISTRIBUTION PARAMETERS; ELECTRONIC-STRUCTURE; PYRRHOTITE SURFACES; FES2(100) SURFACE; PYRITE OXIDATION; FES2; PYRITE; K-EDGE; ENERGY; SULFUR; STATES;
D O I
10.1016/j.apsusc.2016.06.190
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Hard X-ray photoelectron spectroscopy (HAXPES) using an excitation energy range of 2 keV to 6 keV in combination with Fe K- and S K-edge XANES, measured simultaneously in total electron (TEY) and partial fluorescence yield (PFY) modes, have been applied to study near-surface regions of natural polycrystalline pyrite FeS2 and pyrrhotite Fe1-xS before and after etching treatments in an acidic ferric chloride solution. It was found that the following near-surface regions are formed owing to the preferential release of iron from oxidized metal sulfide lattices: (i) a thin, no more than 1-4 nm in depth, outer layer containing polysulfide species, (ii) a layer exhibiting less pronounced stoichiometry deviations and low, if any, concentrations of polysulfide, the composition and dimensions of which vary for pyrite and pyrrhotite and depend on the chemical treatment, and (iii) an extended almost stoichiometric underlayer yielding modified TEY XANES spectra, probably, due to a higher content of defects. We suggest that the extended layered structure should heavily affect the near-surface electronic properties, and processes involving the surface and interfacial charge transfer. (C) 2016 Elsevier B.V. All rights reserved.
引用
收藏
页码:796 / 804
页数:9
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