Caustic imaging of gallium droplets using mirror electron microscopy

被引：26

作者：

Kennedy, S. M. ^{[1
]}

Zheng, C. X. ^{[1
]}

Tang, W. X. ^{[1
]}

Paganin, D. M. ^{[1
]}

Jesson, D. E. ^{[1
]}

机构：

[1] Monash Univ, Sch Phys, Clayton, Vic 3800, Australia

来源：

ULTRAMICROSCOPY | 2011年 / 111卷 / 05期

基金：

澳大利亚研究理事会;

关键词：

Mirror electron microscopy (MEM); Caustic imaging; Ga droplets; GaAs; Contact angle; OPERATION MODE; OBJECT SURFACE; SIMULATION; RESOLUTION; CONTRAST; FIELDS;

D O I：

10.1016/j.ultramic.2011.01.019

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

We discuss a new interpretation of mirror electron microscopy (MEM) images, whereby electric field distortions caused by surface topography and/or potential variations are sufficiently large to create caustics in the image contrast. Using a ray-based trajectory method, we consider how a family of rays overlaps to create caustics in the vicinity of the imaging plane of the magnetic objective lens. Such image caustics contain useful information on the surface topography and/or potential, and can be directly related to surface features. Specifically we show how a through-focus series of MEM images can be used to extract the contact angle of a Ga droplet on a GaAs (001) surface. (C) 2011 Elsevier B.V. All rights reserved.

引用

页码：356 / 363

页数：8

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