Manufacturing a CSP at wafer level

被引:0
作者
Simon, J [1 ]
Wolf, J [1 ]
Kallmayer, C [1 ]
Töpper, M [1 ]
Reichl, H [1 ]
机构
[1] FHG IZM, D-13355 Berlin, Germany
来源
MICRO MATERIALS, PROCEEDINGS | 2000年
关键词
microelectronic packaging; Chip Size Packaging; wafer level package; Diepack;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The CSP (Chip Size or Chip Scale Package) is miniaturised package which is an alternative to COB (Chip on Board) and DCA (Direct Chip Attach/Flip Chip). Manufacturing CSP's at waferlevel becomes a challenging task to reduce package cost. A major issue in chip size packaging is the board level reliability, because the package has to match the different CTE's of silicon and PCB (3 ppm/K versus 16-18 ppm/K), In contrast to flip chip technology no underfilling should be required. Therefore a wafer level package (WLP) needs a stress absorbing construction to avoid underfilling. A wafer level CSP called S-3-Diepack was developed at Technical University of Berlin within the European ESPRIT project ESCHETA. The S-3-Diepack uses a solder support structure (S-3) to avoid underfilling. The S-3-Diepack achieves a board level reliability which may be sufficient for consumer products.
引用
收藏
页码:236 / 239
页数:4
相关论文
empty
未找到相关数据