Advancement of X-ray radiography using microfocus X-ray source in conjunction with amplitude grating and SOI pixel detector, SOPHIAS

被引:4
作者
Hosono, Ryo [1 ]
Kawabata, Tomoki [2 ]
Hayashida, Kiyoshi [2 ]
Kudo, Togo [3 ,4 ]
Ozaki, Kyosuke [3 ]
Teranishi, Nobukazu [3 ,5 ]
Hatsui, Takaki [3 ]
Hosoi, Takuji [1 ]
Watanabe, Heiji [1 ]
Shimura, Takayoshi [1 ]
机构
[1] Osaka Univ, Grad Sch Engn, Dept Mat & Life Sci, 2-1 Yamadaoka, Suita, Osaka 5650871, Japan
[2] Osaka Univ, Grad Sch Sci, Dept Earth & Space Sci, 1-1 Machikaneyama Cho, Toyonaka, Osaka 5600043, Japan
[3] RIKEN, RIKEN SPring Ctr 8, 1-1-1 Kouto, Sayo, Hyogo 6795148, Japan
[4] Japan Synchrotron Radiat Res Inst JASRI, 1-1-1 Kouto, Sayo, Hyogo 6795198, Japan
[5] Univ Hyogo, 1-1-2 Koto, Kamigori, Hyogo 6781205, Japan
来源
OPTICS EXPRESS | 2018年 / 26卷 / 16期
基金
日本学术振兴会;
关键词
INTERFEROMETRY;
D O I
10.1364/OE.26.021044
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We show how to improve microfocus X-ray radiography by using the SOPHIAS silicon-on-insulator pixel detector in conjunction with an amplitude grating. Single-exposure multi-energy absorption and differential phase contrast imaging was performed using the single amplitude grating method. The sensitivity in differential phase contrast imaging in a two-pixel-pitch setup was enhanced by 39% in comparison with the previously reported method [F. Krejci, Rev. Sci. Instrum. 81, 113702 (2010).] by analyzing charge-sharing effects. Small-angle-scattering imaging was also possible in the two-pixel-pitch setup by counting the number of X-ray photons passing the pixel boundaries. (C) 2018 Optical Society of America under the terms of the OSA Open Access Publishing Agreement
引用
收藏
页码:21044 / 21053
页数:10
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