Advancement of X-ray radiography using microfocus X-ray source in conjunction with amplitude grating and SOI pixel detector, SOPHIAS

被引：4

作者：

Hosono, Ryo ^{[1
]}

Kawabata, Tomoki ^{[2
]}

Hayashida, Kiyoshi ^{[2
]}

Kudo, Togo ^{[3
,4
]}

Ozaki, Kyosuke ^{[3
]}

Teranishi, Nobukazu ^{[3
,5
]}

Hatsui, Takaki ^{[3
]}

Hosoi, Takuji ^{[1
]}

Watanabe, Heiji ^{[1
]}

Shimura, Takayoshi ^{[1
]}

机构：

[1] Osaka Univ, Grad Sch Engn, Dept Mat & Life Sci, 2-1 Yamadaoka, Suita, Osaka 5650871, Japan

[2] Osaka Univ, Grad Sch Sci, Dept Earth & Space Sci, 1-1 Machikaneyama Cho, Toyonaka, Osaka 5600043, Japan

[3] RIKEN, RIKEN SPring Ctr 8, 1-1-1 Kouto, Sayo, Hyogo 6795148, Japan

[4] Japan Synchrotron Radiat Res Inst JASRI, 1-1-1 Kouto, Sayo, Hyogo 6795198, Japan

[5] Univ Hyogo, 1-1-2 Koto, Kamigori, Hyogo 6781205, Japan

来源：

OPTICS EXPRESS | 2018年 / 26卷 / 16期

基金：

日本学术振兴会;

关键词：

INTERFEROMETRY;

D O I：

10.1364/OE.26.021044

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We show how to improve microfocus X-ray radiography by using the SOPHIAS silicon-on-insulator pixel detector in conjunction with an amplitude grating. Single-exposure multi-energy absorption and differential phase contrast imaging was performed using the single amplitude grating method. The sensitivity in differential phase contrast imaging in a two-pixel-pitch setup was enhanced by 39% in comparison with the previously reported method [F. Krejci, Rev. Sci. Instrum. 81, 113702 (2010).] by analyzing charge-sharing effects. Small-angle-scattering imaging was also possible in the two-pixel-pitch setup by counting the number of X-ray photons passing the pixel boundaries. (C) 2018 Optical Society of America under the terms of the OSA Open Access Publishing Agreement

引用

页码：21044 / 21053

页数：10

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