Wetting of oriented and etched ultrahigh molecular weight polyethylene

被引:0
|
作者
Silverstein, MS [1 ]
Sadovsky, J [1 ]
Alon, D [1 ]
Wahad, V [1 ]
机构
[1] Technion Israel Inst Technol, Dept Mat Engn, IL-32000 Haifa, Israel
关键词
ultrahigh molecular weight polyethylene; wetting; orientation; plasma etching; chromic acid etching;
D O I
10.1002/(SICI)1097-4628(19990418)72:3<405::AID-APP10>3.0.CO;2-I
中图分类号
O63 [高分子化学(高聚物)];
学科分类号
070305 ; 080501 ; 081704 ;
摘要
Highly oriented gel-spun ultrahigh molecular weight polyethylene (UHMWPE) fibers possess many outstanding properties desirable for composite materials but their adhesion to such matrices as epoxy is poor. This article describes the combined effects of drawing and surface modification on the bulk and surface properties of gel-cast UHMWPE films emphasizing the effects of etching on both undrawn and drawn films. Drawing the films yields a fibrillar structural hierarchy similar to UHMWPE fibers and a significant increase in orientation, melting point, modulus, and strength. The effects of drawing on bulk properties were more significant than those of etching. The poor adhesion of epoxy to the smooth, fibrillar, and relatively nonpolar drawn film surface improves significantly with oxidization and roughening on etching. The interlaminar shear failure occurred cohesively in the UHMWPE, and thus the interlaminar shear failure strength was greater for the drawn UHMWPE with its greater tensile strength. Nitrogen plasma etching yielded the best results, both removing any low molecular weight surface layer and etching the UHMWPE beneath. Oxygen plasma etching enhanced wetting but was too harsh, causing extensive surface degradation and a significant reduction in mechanical properties. (C) 1999 John Wiley & Sons, Inc.
引用
收藏
页码:405 / 418
页数:14
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