Electron spin resonance with up to 20 spin sensitivity measured using a superconducting flux qubit

被引：15

作者：

Budoyo, Rangga P. ^{[1
,2
]}

Kakuyanagi, Kosuke ^{[1
]}

Toida, Hiraku ^{[1
]}

Matsuzaki, Yuichiro ^{[1
,3
]}

Saito, Shiro ^{[1
]}

机构：

[1] NTT Corp, NTT Basic Res Labs, 3-1 Morinosato Wakamiya, Atsugi, Kanagawa 2430198, Japan

[2] Natl Univ Singapore, Ctr Quantum Technol, Singapore, Singapore

[3] Natl Inst Adv Ind Sci & Technol, Tsukuba, Ibaraki, Japan

来源：

APPLIED PHYSICS LETTERS | 2020年 / 116卷 / 19期

关键词：

NOISE;

D O I：

10.1063/1.5144722

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We report on electron spin resonance spectroscopy measurements using a superconducting flux qubit with a sensing volume of 6 fl. The qubit is read out using a frequency-tunable Josephson bifurcation amplifier, which leads to an inferred measurement sensitivity of about 20 spins in a 1 s measurement. This sensitivity represents an order of magnitude improvement when compared to flux-qubit schemes using a direct current-superconducting quantum interference device switching readout. Furthermore, noise spectroscopy reveals that the sensitivity is limited by flicker (1=f) flux noise.

引用

页数：5

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