BIST: Required for embedded DRAM

被引：0
|
作者：
Tanoi, S
机构：
来源：
INTERNATIONAL TEST CONFERENCE 1998, PROCEEDINGS | 1998年
关键词：
D O I：
10.1109/TEST.1998.743349
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：1149 / 1149
页数：1
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