Fundamental analysis of resistive nano-crossbars for the use in hybrid Nano/CMOS-memory

被引:149
作者
Flocke, Alexander [1 ]
Noll, Tobias G. [1 ]
机构
[1] Rhein Westfal TH Aachen, Chair Elect Engn & Comp Sci, D-52062 Aachen, Germany
来源
ESSCIRC 2007: PROCEEDINGS OF THE 33RD EUROPEAN SOLID-STATE CIRCUITS CONFERENCE | 2007年
关键词
D O I
10.1109/ESSCIRC.2007.4430310
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
As a possible successor for CMOS memory, hysteretic materials organized in crossbar structures are currently being investigated. Here, passive materials are of special importance as they maintain their functionality even when scaled down to the nanometer domain. With their regularity and inherent device density so-called nano-scaled crossbars seem to be very interesting for future components beyond the present scope of the ITRS-CMOS roadmap. But, due to their passive behavior they will not be capable of operating on their own without active devices that restore signal levels. This work investigates the limitations resistive hysteretic crossbars face due to their very nature and what performance CMOS read circuits will have to offer to let hybrid circuits result in a functional new technology.
引用
收藏
页码:328 / 331
页数:4
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