Graphene Epitaxy by Chemical Vapor Deposition on SiC

被引:302
作者
Strupinski, W. [1 ]
Grodecki, K. [1 ,2 ]
Wysmolek, A. [2 ]
Stepniewski, R. [2 ]
Szkopek, T. [3 ]
Gaskell, P. E. [3 ]
Grueneis, A. [4 ,5 ]
Haberer, D. [4 ]
Bozek, R. [2 ]
Krupka, J. [6 ]
Baranowski, J. M. [1 ,2 ]
机构
[1] Inst Elect Mat Technol, PL-01919 Warsaw, Poland
[2] Univ Warsaw, Fac Phys, PL-00681 Warsaw, Poland
[3] McGill Univ, Dept Elect & Comp Engn, Montreal, PQ H3A 2A7, Canada
[4] IFW Dresden, D-01171 Dresden, Germany
[5] Univ Vienna, A-1090 Vienna, Austria
[6] Warsaw Univ Technol, Inst Microelect & Optoelect, PL-00662 Warsaw, Poland
关键词
Graphene; epitaxy; CVD; sublimation; SiC; carbon deposition; FEW-LAYER GRAPHENE; LARGE-AREA; FILMS; GROWTH; CARBON; UNIFORMITY; GRAPHITE; SURFACE; LEED;
D O I
10.1021/nl200390e
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
We demonstrate the growth of high quality graphene layers by chemical vapor deposition (CVD) on insulating and conductive SiC substrates. This method provides key advantages over the well developed epitaxial graphene growth by Si sublimation that has been known for decades.(1) CVD growth is much less sensitive to SiC surface defects resulting in high electron mobilities of similar to 1800 cm(2)/(V s) and enables the controlled synthesis of a determined number of graphene layers with a defined doping level. The high quality of graphene is evidenced by a unique combination of angle-resolved photoemission spectroscopy, Raman spectroscopy, transport measurements, scanning tunneling microscopy and ellipsometry. Our measurements indicate that CVD grown graphene is under less compressive strain than its epitaxial counterpart and confirms the existence of an electronic energy band gap. These features are essential for future applications of graphene electronics based on wafer scale graphene growth.
引用
收藏
页码:1786 / 1791
页数:6
相关论文
共 48 条
[1]  
Bae S, 2010, NAT NANOTECHNOL, V5, P574, DOI [10.1038/nnano.2010.132, 10.1038/NNANO.2010.132]
[2]   Electronic confinement and coherence in patterned epitaxial graphene [J].
Berger, Claire ;
Song, Zhimin ;
Li, Xuebin ;
Wu, Xiaosong ;
Brown, Nate ;
Naud, Cecile ;
Mayou, Didier ;
Li, Tianbo ;
Hass, Joanna ;
Marchenkov, Atexei N. ;
Conrad, Edward H. ;
First, Phillip N. ;
de Heer, Wait A. .
SCIENCE, 2006, 312 (5777) :1191-1196
[3]   Symmetry breaking in few layer graphene films [J].
Bostwick, Aaron ;
Ohta, Taisuke ;
McChesney, Jessica L. ;
Emtsev, Konstantin V. ;
Seyller, Thomas ;
Horn, Karsten ;
Rotenberg, Eli .
NEW JOURNAL OF PHYSICS, 2007, 9
[4]   Growth kinetics of epitaxial graphene on SiC substrates [J].
Drabinska, A. ;
Grodecki, K. ;
Strupinski, W. ;
Bozek, R. ;
Korona, K. P. ;
Wysmolek, A. ;
Stepniewski, R. ;
Baranowski, J. M. .
PHYSICAL REVIEW B, 2010, 81 (24)
[5]   From Conception to Realization: An Historial Account of Graphene and Some Perspectives for Its Future [J].
Dreyer, Daniel R. ;
Ruoff, Rodney S. ;
Bielawski, Christopher W. .
ANGEWANDTE CHEMIE-INTERNATIONAL EDITION, 2010, 49 (49) :9336-9344
[6]  
EIZENBERG M, 1979, SURF SCI, V82, P228, DOI 10.1016/0039-6028(79)90330-3
[7]  
Emtsev KV, 2009, NAT MATER, V8, P203, DOI [10.1038/nmat2382, 10.1038/NMAT2382]
[8]   Probing mechanical properties of graphene with Raman spectroscopy [J].
Ferralis, Nicola .
JOURNAL OF MATERIALS SCIENCE, 2010, 45 (19) :5135-5149
[9]   Evolution in surface morphology of epitaxial graphene layers on SiC induced by controlled structural strain [J].
Ferralis, Nicola ;
Kawasaki, Jason ;
Maboudian, Roya ;
Carraro, Carlo .
APPLIED PHYSICS LETTERS, 2008, 93 (19)
[10]   Evidence of Structural Strain in Epitaxial Graphene Layers on 6H-SiC(0001) [J].
Ferralis, Nicola ;
Maboudian, Roya ;
Carraro, Carlo .
PHYSICAL REVIEW LETTERS, 2008, 101 (15)