Determination of refractive index of transparent plate by Fabry-Perot fringe analysis

被引：2

作者：

Choi, Hee Joo ^{[1
]}

Lim, Hwan Hong ^{[1
]}

Moon, Han Seb ^{[1
]}

Eom, Tae Bong ^{[2
]}

Ju, Jung Jin ^{[3
]}

Cha, Myoungsik ^{[1
]}

机构：

[1] Pusan Natl Univ, Dept Phys, Pusan 609735, South Korea

[2] Korea Res Inst Standards & Sci, Daejeon 305340, South Korea

[3] Elect & Telecommun Res Inst, Daejeon 305700, South Korea

来源：

INTERFEROMETRY XV: TECHNIQUES AND ANALYSIS | 2010年 / 7790卷

关键词：

Index of refraction; interferometry; metrology; THICKNESS; WAVELENGTH; MICHELSON;

D O I：

10.1117/12.862363

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We developed a simple and accurate method for measuring the refractive indices of transparent plates by analyzing the transmitted fringe pattern as a function of angle of incidence. By using two different wavelengths, we resolved the 2 pi-ambiguity inherent to the phase measurement involving a thick medium, leading to independent determination of the absolute index of refraction and the thickness with a relative uncertainty smaller than 10(-5) for a 1 mm-thick fused silica plate. The accuracy of our method was confirmed with a standard reference material.

引用

页数：6

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