Photonics-Based Near-Field Measurement and Far-Field Characterization for 300-GHz Band Antenna Testing

In this study, photonics-based near-field measurement and far-field characterization in a 300-GHz band are demonstrated using an electrooptic (EO) sensor with planar scanning. The field to be measured is up-converted to the optical domain (1550 nm) at the EO sensor and delivered to the measurement system with optical fiber. The typical phase drift of the system is 0.46 degrees for the one-dimensional measurement time of 13 s, which is smaller than the standard deviation of the phase measurement of 1.2 degrees for this time scale. The far-field patterns of a horn antenna calculated from the measured near-field distribution are compared with that measured with the direct far-field measurement system using a vector network analyzer. For the angular related parameters, the accuracy of the results obtained by our near-field measurement are comparable to that of those obtained by direct far-field measurements. The sidelobe level discrepancy (approximately 1 dB) between the results obtained based on our near-field measurement and those from the direct far-field measurements are attributed to the excess noise of the probe correction data. We believe that photonics-based near-field measurements with spherical EO probe scanning will pave the way for the characterization of high-gain antennas at the 300-GHz band.