High quality amorphous indium zinc oxide thin films synthesized by pulsed laser deposition

被引:26
作者
Socol, G. [1 ]
Craciun, D. [1 ]
Mihailescu, I. N. [1 ]
Stefan, N. [1 ]
Besleaga, C. [2 ]
Ion, L. [2 ]
Antohe, S. [2 ]
Kim, K. W. [3 ]
Norton, D. [3 ]
Pearton, S. J. [3 ]
Galca, A. C. [4 ]
Craciun, V. [1 ,3 ]
机构
[1] Natl Inst Lasers Plasma & Radiat Phys, Magurele, Ilfov, Romania
[2] Univ Bucharest, Fac Phys, Magurele Ilfov 077125, Romania
[3] Univ Florida, Gainesville, FL USA
[4] Natl Inst Mat Phys, Magurele, Ilfov, Romania
关键词
Amorphous indium zinc oxide; Transparent conductive oxide; Pulsed laser deposition; Thin films; STRUCTURAL INVESTIGATIONS; ELECTRICAL-PROPERTIES; ZNO; CRYSTALLINE; LAYERS;
D O I
10.1016/j.tsf.2011.04.196
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Indium zinc oxide films were grown from targets with two different In atomic concentration [In/(In+Zn)] of 40% and 80% by the pulsed laser deposition technique on glass substrates from room temperature up to 100 degrees C. X-ray diffraction and reflectometry investigations showed that films were amorphous and dense. Thin films (thickness<100 nm) exhibited higher optical transmittance and resistivities than thick films (thickness>1000 nm), probably caused by a significant decrease of oxygen vacancies due to atmosphere exposure. Films deposited from the In rich target under an oxygen pressure of 1 Pa exhibited optical transmittance higher than 85%, resistivities around 5-7x10(-4) Omega cm and mobilities in the 47-54 cm(2)/V s range. (C) 2011 Elsevier B. V. All rights reserved.
引用
收藏
页码:1274 / 1277
页数:4
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