A defect estimation approach for sequential inspection using a modified capture-recapture model

被引:0
|
作者
Chang, CP
Lv, JL
Chu, CP
机构
来源
PROCEEDINGS OF THE 29TH ANNUAL INTERNATIONAL COMPUTER SOFTWARE AND APPLICATIONS CONFERENCE | 2005年
关键词
inspection; capture-recapture modeli defect estimation; and re-inspection model;
D O I
暂无
中图分类号
TP31 [计算机软件];
学科分类号
081202 ; 0835 ;
摘要
Defect prediction is an important process in the evaluation of software quality. To accurately predict the rate of software defects can not only facilitate software review decisions, but can also improve software quality. In this paper, we have provided a defect estimation approach, which uses defective data from sequential inspections to increase the accuracy Of estimating defects. To demonstrate potential improvements, the results of our approach were compared to those of two other popular estimation approaches, the Capture-Recapture model and the Reinspection model., By using the proposed approach, software organizations may increase the accuracy of their defect predictions and reduce the effort of subsequent inspections.
引用
收藏
页码:41 / 46
页数:6
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