Pseudo-aberration free focus condition for atomic resolution electron microscope images

被引：3
作者：
Hashimoto, H [1 ]
Endoh, H
Hashimoto, M
Luo, ZP
Song, MF
机构：
[1] Okayama Univ Sci, Okayama 700, Japan
[2] Kyoto Inst Technol, Sakyo Ku, Kyoto 606, Japan
[3] Osaka Setsunan Univ, Neyagawa, Osaka, Japan
来源：
MICRON | 1998年 / 29卷 / 2-3期
关键词：
Aberration Free Focus; pseudo-Aberration Free Focus; electron microscope images of atoms; atom resolution images of crystals;
D O I：
10.1016/S0968-4328(98)00008-0
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
Spherical Aberration Free Focus (AFF) conditions for taking atomic resolution electron microscope images of single crystals and pseudo-Aberration Free Focus (psi s-AFF) conditions for taking atomic images of more than two adjoining single crystals are discussed by using diagrams of C-s (spherical aberration coefficient) and Delta f (defocus). Calculated image contrast in those conditions is shown for three individual crystals of MgO, MgAl2O4, Al2O3 and their adjoining crystal blocks. It is shown that at least two kinds of Bragg reflected waves can be in the AFF condition in each case, and thus the size of the aperture for limiting the waves becomes important in some cases. C-s, can be changed by changing the position of the specimen along the objective lens axis but highly coherent illuminating waves are needed for large C-s, and Delta f. (C) 1998 Elsevier Science Ltd. All rights reserved.
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页码：113 / 121
页数：9
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