Low Capture Power Dictionary-based Test Data Compression

被引：0

作者：

Sismanoglou, Panagiotis ^{[1
]}

Nikolos, Dimitris ^{[1
]}

机构：

[1] Univ Patras, Dept Comp Engn & Informat, GR-26110 Patras, Greece

来源：

PROCEEDINGS OF THE SEVENTEENTH INTERNATIONAL SYMPOSIUM ON QUALITY ELECTRONIC DESIGN ISQED 2016 | 2016年

关键词：

Dictionary; test data compression; low-power testing; SCAN TEST; ENTRIES;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this paper we first present a new test vector multi-bit correction technique for capture power reduction (average and peak) in scan based launch-on-capture transition delay testing of IP cores. Then we present a method which combines the test vector multi-bit correction technique and the dictionary based test data compression method of [11] in order to derive compressed test data with low capture power. Main characteristic of this technique is that the reduction of the capture power is obtained without (or with marginal) degradation of the compression efficiency. The efficiency of the proposed method is verified with simulations.

引用

页码：289 / 294

页数：6

共 15 条

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