Ground-Bouncing-Noise-Aware Combinational MTCMOS Circuits

被引:28
作者
Jiao, Hailong [1 ]
Kursun, Volkan [1 ]
机构
[1] Hong Kong Univ Sci & Technol, Dept Elect & Comp Engn, Hong Kong, Hong Kong, Peoples R China
关键词
Battery lifetime; idle circuit; intermediate relaxation mode; leakage power consumption; on-chip noise; power gating; SLEEP mode; SLEEP to ACTIVE mode transition; LEAKAGE REDUCTION; METHODOLOGY;
D O I
10.1109/TCSI.2010.2041505
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Ground bouncing noise produced during the SLEEP to ACTIVE mode transitions is an important challenge in standard multithreshold CMOS (MTCMOS) circuits. The effectiveness of different noise-aware combinational MTCMOS circuit techniques to deal with the ground-bouncing-noise phenomenon is evaluated in this paper. An intermediate relaxation mode is investigated to gradually dump the charge stored on the virtual lines to the real ground distribution network during the SLEEP to ACTIVE mode transitions. The dependence of ground bouncing noise on the sleep transistor size and temperature is characterized with different power-gating structures. The peak amplitude of ground bouncing noise is reduced by up to 76.62% with the noise-aware techniques without sacrificing the savings in leakage power consumption as compared with standard MTCMOS circuits in a 90-nm CMOS technology.
引用
收藏
页码:2053 / 2065
页数:13
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