In-depth analysis of transient errors of inline IV measurements

被引：8

作者：

Roth, Thomas ^{[1
]}

Wichmann, Daniel ^{[1
]}

Meyer, Karsten ^{[1
]}

Orlob, Matthias ^{[1
]}

机构：

[1] Bosch Solar Energy AG, D-99099 Erfurt, Germany

来源：

PROCEEDINGS OF THE SILICONPV 2011 CONFERENCE (1ST INTERNATIONAL CONFERENCE ON CRYSTALLINE SILICON PHOTOVOLTAICS) | 2011年 / 8卷

关键词：

Characterization; IV measurements; transient effects; fill factor;

D O I：

10.1016/j.egypro.2011.06.106

中图分类号：

TE [石油、天然气工业]; TK [能源与动力工程];

学科分类号：

0807 ; 0820 ;

摘要：

Silicon solar cells are prone to transient effects during fast acquisition of the illuminated IV parameters, as it is commonly carried out using industrial cell testers. It is known that the IV curve sweep time and direction have a significant impact on the measured fill factor and open circuit voltage. Within this contribution, the hysteresis effect on the fill factor and the open circuit voltage are investigated for different types of industrially fabricated silicon solar cells. This investigation is carried out on two different, commonly used, flash-based cell testers. (C) 2011 Published by Elsevier Ltd. Selection and/or peer-review under responsibility of SiliconPV 2011.

引用

页码：82 / 87

页数：6

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