Effect of soft underlayer permeability on wide area track erasure in perpendicular recording

被引：12

作者：

Zhou, JN ^{[1
]}

Acharya, BR ^{[1
]}

Gill, P ^{[1
]}

Abarra, EN ^{[1
]}

Zheng, M ^{[1
]}

Choe, G ^{[1
]}

机构：

[1] MMC Technol, San Jose, CA 95131 USA

来源：

IEEE TRANSACTIONS ON MAGNETICS | 2005年 / 41卷 / 10期

关键词：

antiferromagnetic coupling; overwrite; permeability; perpendicular recording; soft underlayer; wide area adjacent; track erasure;

D O I：

10.1109/TMAG.2005.855275

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The permeability of the magnetic soft underlayer (SUL) was systematically varied through SUL structure change, and its effect on wide area adjacent track erasure (ATE) and media overwrite (OW) was studied. Results suggest that ATE decreases with SUL permeability, and it involves only a finite thickness of the SUL. OW increases with SUL permeability as well as SUL thickness. In addition, ATE is less affected by magnetic spacing than OW. Antiparallel coupled SUL (APS) improves ATE. A double-APS structure with a permeability gradient is proposed to optimize OW and ATE performance.

引用

页码：3160 / 3162

页数：3

共 17 条

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