Correlation between SiOx content and properties of DLC:SiOx films prepared by PECVD

被引:38
|
作者
Zajícková, L
Bursíková, V
Perina, V
Macková, A
Janca, J
机构
[1] Masaryk Univ, Dept Phys Elect, CS-61137 Brno, Czech Republic
[2] Acad Sci Czech Republ, Inst Nucl Phys, Prague, Czech Republic
关键词
PECVD; Vickers hardness test; Rutherford backscattering spectroscopy; diamond-like carbon; silicon;
D O I
10.1016/S0257-8972(03)00681-9
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Hard diamond-like carbon (DLC) films with an addition of SiOx were deposited in capacitively coupled r.f. discharges from a mixture of methane and hexamethyldisiloxane (HMDSO). The flow rate of HMDSO was changed in order to vary the SiOx content in the films. Complete atomic composition of the films was determined by Rutherford backscattering spectroscopy combined with elastic recoil detection analysis. The thickness and the optical properties were obtained from the ellipsometric measurements. The mechanical properties were studied by a depth sensing indentation technique using Fischerscope H100 tester. The O/Si ratio in DLC:SiOx films was 0.286 +/- 0.008 and the content of SiOx increased with the HMDSO-to-methane flow rate ratio q. The DLC:SiOx films were close to DLC films as concerning the optical properties in the UV/visible and the high hardness if q was maximum 0.25. However, the compressive stress in the films was reduced, the film fracture toughness was improved and the deposition rate increased. (C) 2003 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:281 / 285
页数:5
相关论文
共 50 条
  • [21] FTIR, AFM and PL properties of thin SiOx films deposited by HFCVD
    Luna-Lopez, J. A.
    Garcia-Salgado, G.
    Diaz-Becerril, T.
    Carrillo Lopez, J.
    Vazquez-Valerdi, D. E.
    Juarez-Santiesteban, H.
    Rosendo-Andres, E.
    Coyopol, A.
    MATERIALS SCIENCE AND ENGINEERING B-ADVANCED FUNCTIONAL SOLID-STATE MATERIALS, 2010, 174 (1-3): : 88 - 92
  • [22] Investigation of properties of Cu containing DLC films produced by PECVD process
    Dwivedi, Neeraj
    Kumar, Sushil
    Malik, Hitendra K.
    Sreekumar, C.
    Dayal, Saurabh
    Rauthan, C. M. S.
    Panwar, O. S.
    JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 2012, 73 (02) : 308 - 316
  • [23] Dependence of the physical properties DLC films by PECVD on the Ar gas addition
    Kim, J
    Lee, C
    JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 2003, 42 : S956 - S960
  • [24] Temperature dependence of mechanical properties of DLC/Si protective coatings prepared by PECVD
    Bursíková, V
    Navrátil, V
    Zajícková, L
    Janca, J
    MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 2002, 324 (1-2): : 251 - 254
  • [25] Si nanocrystal-containing SiOx (x < 2) produced by thermal annealing of PECVD realized thin films
    Bedjaoui, M
    Despax, B
    Caumont, M
    Bonafos, C
    MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 2005, 124 : 508 - 512
  • [26] Optical and Compositional Properties of SiOx Films Deposited by HFCVD: Effect of the Hydrogen Flow
    Luna Lopez, J. A.
    Vazquez Valerdi, D. E.
    Benitez Lara, A.
    Garcia Salgado, G.
    Hernandez-de la Luz, A. D.
    Morales Sanchez, A.
    Flores Gracia, F. J.
    Dominguez, M. A.
    JOURNAL OF ELECTRONIC MATERIALS, 2017, 46 (04) : 2309 - 2322
  • [27] Observation and enhancement of visible photoluminescence of PECVD a-SiOx:H (x < 2) thin films by microcavity effect
    Bacioglu, Akin
    Kodolbas, Alp Osman
    Oktu, Ozcan
    PHYSICA STATUS SOLIDI C - CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 7 NO 5, 2010, 7 (05): : 1405 - 1408
  • [28] Effect of the additive gas on the bonding structure and mechanical properties of the DLC films deposited by RF-PECVD
    Choi, Bong-Geun
    JOURNAL OF THE KOREAN CRYSTAL GROWTH AND CRYSTAL TECHNOLOGY, 2015, 25 (04): : 145 - 152
  • [29] Structural and Optical Properties of PECVD-prepared Cadmium Telluride Thin Films
    Mochalov, Leonid
    Vshivtsev, Maksim
    Kudryashov, Mikhail
    Slapovskaya, Ekaterina
    Safronova, Sophia
    2024 24TH INTERNATIONAL CONFERENCE ON TRANSPARENT OPTICAL NETWORKS, ICTON 2024, 2024,
  • [30] Study on the correlation between film composition and piezoresistive properties of PECVD SixCy thin films
    Fraga, Mariana A.
    Koberstein, Leandro L.
    SILICON CARBIDE AND RELATED MATERIALS 2012, 2013, 740-742 : 431 - +