Stress gradient analysis by noncomplanar x-ray diffraction and corresponding refraction correction

被引：13

作者：

Benediktovitch, Andrei ^{[1
]}

Ulyanenkova, Tatjana ^{[2
]}

Keckes, Jozef ^{[3
]}

Ulyanenkov, Alex ^{[2
]}

机构：

[1] Belarusian State Univ, Dept Theoret Phys, Nezavisimosti Ave 4, Minsk, BELARUS

[2] Rigaku Europe SE, Ettlingen, Germany

[3] Univ Leoben, Dept Phys, Leoben, Austria

来源：

RESIDUAL STRESSES IX | 2014年 / 996卷

关键词：

noncomplanar diffraction geometry; residual stress depth profiles; refraction and absorption; DWBA; DEPTH;

D O I：

10.4028/www.scientific.net/AMR.996.162

中图分类号：

TH [机械、仪表工业];

学科分类号：

0802 ;

摘要：

X-ray residual stress analysis is a widespread nondestructive technique to investigate the residual stress and residual stress gradient in thin films and protective coatings. In the present contribution we introduce a new method based on the noncomplanar measurement geometry that allow to span large area of sin(2)psi and penetration depth values without sample inclination. The refraction correction and absorption is considered in details for the noncomplanar measurements. The proposed technique is applied to determine stress gradients of blasted hard TiN coatings.

引用

页码：162 / +

页数：2

共 15 条

[1]

[Anonymous], 2012, MODERN DIFFRACTION M

[2] In Situ High Temperature X-Ray Diffraction Reveals Residual Stress Depth-Profiles in Blasted TiN Hard Coatings [J].