2017 atomic spectrometry update - a review of advances in X-ray fluorescence spectrometry and its special applications

被引：27

作者：

West, Margaret ^{[1
]}

Ellis, Andrew T. ^{[2
]}

Streli, Christina ^{[3
]}

Vanhoof, Christine ^{[4
]}

Wobrauschek, Peter ^{[3
]}

机构：

[1] 405 Whirlowdale Rd, Sheffield S11 9NF, S Yorkshire, England

[2] 8 Burgess Close, Abingdon OX14 3JT, Oxon, England

[3] Vienna Univ Technol, Atominst, Stad Allee 2, A-1020 Vienna, Austria

[4] Flemish Inst Technol Res VITO, Boeretang 200, B-2400 Mol, Belgium

来源：

JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY | 2017年 / 32卷 / 09期

关键词：

BACKGROUND SUBTRACTION METHOD; MONTE-CARLO-SIMULATION; ELEMENTAL COMPOSITION; COMPUTED-TOMOGRAPHY; CROSS-SECTIONS; TRACE-ELEMENTS; PORTABLE-XRF; HEAVY-METALS; DETECTOR; SYSTEM;

D O I：

10.1039/c7ja90035j

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

This review describes advances in the XRF group of techniques published approximately between April 2016 and March 2017. With technique maturity, it is the sample rather than the instrumentation that limits its wider development, so regular readers are advised to consult our companion application updates for advances in XRF related to specific sample types. In this reconfigured update the Instrumentation section offers advances in hardware and software developments for off-site and laboratory investigations including synchrotron, TXRF and related techniques. However, publications that reflect increasing interest in the non-destructive advantages of X-ray systems for cultural heritage applications remain within this update.

引用

页码：1629 / 1649

页数：21

共 136 条

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Malagodi, M. ;

Rossi, B. ;

Ruffolo, S. A. ;

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