The influence of the voltage rise rate on the breakdown of an atmospheric pressure helium nanosecond parallel-plate discharge

被引:43
作者
Huang, Bang-Dou [1 ]
Takashima, Keisuke [2 ]
Zhu, Xi-Ming [3 ]
Pu, Yi-Kang [1 ]
机构
[1] Tsinghua Univ, Dept Engn Phys, Beijing 100084, Peoples R China
[2] Tohoku Univ, Dept Elect Engn, Aoba Ku, Sendai, Miyagi 9808579, Japan
[3] Ruhr Univ Bochum, Inst Plasma & Atom Phys, D-44780 Bochum, Germany
关键词
voltage rise rate; breakdown; nanosecond discharge; GENERATION; EXCITATION; ELECTRONS;
D O I
10.1088/0022-3727/48/12/125202
中图分类号
O59 [应用物理学];
学科分类号
摘要
The influence of the voltage rise rate on a nanosecond discharge in atmospheric pressure helium is investigated. The experiment is performed with a parallel-plate discharge configuration. The voltage rise rate is varied between 0.17 kV ns(-1) and 0.42 kV ns(-1). It is found that the rise rate of both the discharge current and the emission intensity increases drastically with the voltage rise rate. This demonstrates the remarkable capability of generating high energy electrons in the discharges with a high voltage rise rate. These arguments are supported by the increase in the measured effective electron temperature during the breakdown processes, namely similar to 18 eV when dV/dt is similar to 0.17 kV ns(-1) and similar to 33 eV when dV/dt is similar to 0.42 kV ns(-1). Furthermore, a higher voltage rise rate results in a shorter rise time of both the discharge current and the emission intensity. Since the breakdown process evolves in the form of a cathode directed ionization wave, a shorter rise time indicates faster propagation of the ionization wave. In addition, a simple fluid model is proposed and its predicted results agree reasonably well with the important discharge parameters measured in the experiment, such as the breakdown voltage, the rise rate and rise time of the discharge current.
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页数:10
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共 36 条
[1]   Plasma assisted ignition and high-speed flow control: non-thermal and thermal effects [J].
Adamovich, I. V. ;
Choi, I. ;
Jiang, N. ;
Kim, J-H ;
Keshav, S. ;
Lempert, W. R. ;
Mintusov, E. ;
Nishihara, M. ;
Samimy, M. ;
Uddi, M. .
PLASMA SOURCES SCIENCE & TECHNOLOGY, 2009, 18 (03)
[2]   A COLLISIONAL-RADIATIVE MODEL FOR MICROWAVE DISCHARGES IN HELIUM AT LOW AND INTERMEDIATE PRESSURES [J].
ALVES, LL ;
GOUSSET, G ;
FERREIRA, CM .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1992, 25 (12) :1713-1732
[3]   Breakdown development at high overvoltage: electric field, electronic level excitation and electron density [J].
Anikin, NB ;
Pancheshnyi, SV ;
Starikovskaia, SM ;
Starikovskii, AY .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1998, 31 (07) :826-833
[4]   CROSS-SECTIONS FOR THE IONIZATION-EXCITATION OF HELIUM BY FAST ELECTRONS AND H+, H-2(+) AND H-3(+) IONS - (NP) P-2(0) LEVELS, N=2-5 [J].
BAILEY, M ;
BRUCH, R ;
RAUSCHER, E ;
BLIMAN, S .
JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS, 1995, 28 (13) :2655-2670
[5]  
Bogdanov A, 2004, J PHYS D, V37, P2987
[6]   Optical emission spectroscopy as a diagnostic for plasmas in liquids: opportunities and pitfalls [J].
Bruggeman, Peter ;
Verreycken, Tiny ;
Gonzalez, Manuel A. ;
Walsh, James L. ;
Kong, Michael G. ;
Leys, Christophe ;
Schram, Daan C. .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2010, 43 (12)
[7]   Solving the Boltzmann equation to obtain electron transport coefficients and rate coefficients for fluid models [J].
Hagelaar, GJM ;
Pitchford, LC .
PLASMA SOURCES SCIENCE & TECHNOLOGY, 2005, 14 (04) :722-733
[8]   Breakdown characteristics in pulsed-driven dielectric barrier discharges: influence of the pre-breakdown phase due to volume memory effects [J].
Hoeft, H. ;
Kettlitz, M. ;
Becker, M. M. ;
Hoder, T. ;
Loffhagen, D. ;
Brandenburg, R. ;
Weltmann, K-D .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2014, 47 (46)
[9]   The influence of the repetition rate on the nanosecond pulsed pin-to-pin microdischarges [J].
Huang, Bang-Dou ;
Takashima, Keisuke ;
Zhu, Xi-Ming ;
Pu, Yi-Kang .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2014, 47 (42)
[10]   The spatial-temporal evolution of the electron density and temperature for a nanosecond microdischarge [J].
Huang, Bang-Dou ;
Zhu, Xi-Ming ;
Takashima, Keisuke ;
Pu, Yi-Kang .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2013, 46 (46)