机构:
Hyundai Elect Co Ltd, MCU Design Dept 1, Cheongju 361725, South KoreaHyundai Elect Co Ltd, MCU Design Dept 1, Cheongju 361725, South Korea
Jeon, HK
[1
]
Lee, SY
论文数: 0引用数: 0
h-index: 0
机构:
Hyundai Elect Co Ltd, MCU Design Dept 1, Cheongju 361725, South KoreaHyundai Elect Co Ltd, MCU Design Dept 1, Cheongju 361725, South Korea
Lee, SY
[1
]
Han, DK
论文数: 0引用数: 0
h-index: 0
机构:
Hyundai Elect Co Ltd, MCU Design Dept 1, Cheongju 361725, South KoreaHyundai Elect Co Ltd, MCU Design Dept 1, Cheongju 361725, South Korea
Han, DK
[1
]
机构:
[1] Hyundai Elect Co Ltd, MCU Design Dept 1, Cheongju 361725, South Korea
来源:
PROCEEDINGS OF THE SECOND IEEE ASIA PACIFIC CONFERENCE ON ASICS
|
2000年
关键词:
D O I:
10.1109/APASIC.2000.896987
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
This paper described the new design technology for implementation of noise-free microcontroller unit (MCU), called Nfree(TM) technology that is the solution proposed by Hyundai Electronics Co., Ltd. Preventing an erroneous operation due to noise is one of the basic requirements of many systems and is more seriously required by the MCU that controls the system. And the power noise is one of the most serious noise sources that cause the MCU to malfunction. Therefore, we proposed the novel power noise preventing circuit scheme, called Nfree(TM) technology. If power falls below the voltage level of power failure, the MCU with Nfree(TM)( technology can be reset, frozen or stopped to preserve the system from the malfunction due to the power noise. In MCU with Nfree(TM) technology, the voltage level of power failure and the operating mode that reset, freeze or stop the MCU can be selected by software in according to applications.
机构:
Computer Science Department Technion, Israel Institute of Technology, Haifa 32000, IsraelComputer Science Department Technion, Israel Institute of Technology, Haifa 32000, Israel
El-Yaniv, Ran
Wiener, Yair
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机构:
Computer Science Department Technion, Israel Institute of Technology, Haifa 32000, IsraelComputer Science Department Technion, Israel Institute of Technology, Haifa 32000, Israel
机构:
Massachusetts Gen Hosp, Dept Anesthesia Crit Care & Pain Med, Boston, MA 02114 USA
Harvard Univ, Sch Med, Boston, MA 02115 USAMassachusetts Gen Hosp, Dept Anesthesia Crit Care & Pain Med, Boston, MA 02114 USA
Winkler, Tilo
Melo, Marcos F. Vidal
论文数: 0引用数: 0
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机构:
Massachusetts Gen Hosp, Dept Anesthesia Crit Care & Pain Med, Boston, MA 02114 USA
Harvard Univ, Sch Med, Boston, MA 02115 USAMassachusetts Gen Hosp, Dept Anesthesia Crit Care & Pain Med, Boston, MA 02114 USA
Melo, Marcos F. Vidal
Degani-Costa, Luiza H.
论文数: 0引用数: 0
h-index: 0
机构:
Harvard Univ, Sch Med, Boston, MA 02115 USA
Massachusetts Gen Hosp, Dept Med, Pulm & Crit Care Unit, Boston, MA 02114 USAMassachusetts Gen Hosp, Dept Anesthesia Crit Care & Pain Med, Boston, MA 02114 USA
Degani-Costa, Luiza H.
Harris, R. Scott
论文数: 0引用数: 0
h-index: 0
机构:
Harvard Univ, Sch Med, Boston, MA 02115 USA
Massachusetts Gen Hosp, Dept Med, Pulm & Crit Care Unit, Boston, MA 02114 USAMassachusetts Gen Hosp, Dept Anesthesia Crit Care & Pain Med, Boston, MA 02114 USA
Harris, R. Scott
Correia, John A.
论文数: 0引用数: 0
h-index: 0
机构:
Harvard Univ, Sch Med, Boston, MA 02115 USA
Massachusetts Gen Hosp, Dept Radiol, Radiol Cyclotron Lab, Boston, MA 02114 USAMassachusetts Gen Hosp, Dept Anesthesia Crit Care & Pain Med, Boston, MA 02114 USA
Correia, John A.
Musch, Guido
论文数: 0引用数: 0
h-index: 0
机构:
Massachusetts Gen Hosp, Dept Anesthesia Crit Care & Pain Med, Boston, MA 02114 USA
Harvard Univ, Sch Med, Boston, MA 02115 USAMassachusetts Gen Hosp, Dept Anesthesia Crit Care & Pain Med, Boston, MA 02114 USA
Musch, Guido
Venegas, Jose G.
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h-index: 0
机构:
Massachusetts Gen Hosp, Dept Anesthesia Crit Care & Pain Med, Boston, MA 02114 USA
Harvard Univ, Sch Med, Boston, MA 02115 USAMassachusetts Gen Hosp, Dept Anesthesia Crit Care & Pain Med, Boston, MA 02114 USA
机构:
Tecnun Univ Navarra, Dept Basic Sci, San Sebastian 20018, SpainTecnun Univ Navarra, Dept Basic Sci, San Sebastian 20018, Spain
Martinez, Josu Etxezarreta
Larrarte, Olatz Sanz
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机构:
Tecnun Univ Navarra, Dept Basic Sci, San Sebastian 20018, SpainTecnun Univ Navarra, Dept Basic Sci, San Sebastian 20018, Spain
Larrarte, Olatz Sanz
del Moral, Javier Oliva
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机构:
Tecnun Univ Navarra, Dept Basic Sci, San Sebastian 20018, Spain
Donostia Int Phys Ctr, San Sebastian 20018, SpainTecnun Univ Navarra, Dept Basic Sci, San Sebastian 20018, Spain
del Moral, Javier Oliva
Dastbasteh, Reza
论文数: 0引用数: 0
h-index: 0
机构:
Tecnun Univ Navarra, Dept Basic Sci, San Sebastian 20018, SpainTecnun Univ Navarra, Dept Basic Sci, San Sebastian 20018, Spain
Dastbasteh, Reza
Otxoa, Ruben M.
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机构:
Donostia Int Phys Ctr, San Sebastian 20018, Spain
Hitachi Cambridge Lab, J J Thomson Ave, Cambridge CB3 0HE, EnglandTecnun Univ Navarra, Dept Basic Sci, San Sebastian 20018, Spain