Digital holography for metrologic applications

被引：0

作者：

Kreis, T ^{[1
]}

机构：

[1] BIAS, D-28359 Bremen, Germany

来源：

INTERFEROMETRY IN SPECKLE LIGHT: THEORY AND APPLICATIONS | 2000年

关键词：

D O I：

暂无

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

In digital holography the holograms are recorded by CCD-arrays. The reconstruction of the complex wavefields is performed numerically in the computer. This enormously improves metrologic applications like deformation measurement, contour measurement, vibration analysis, refractive index determination, particle analysis, or microscopy.

引用

页码：205 / 212

页数：8

共 12 条

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