The stability and degradation of PECVD fluoropolymer nanofilms

被引:6
作者
Bowen, James [1 ]
Cheneler, David [2 ]
机构
[1] Open Univ, Sch Engn & Innovat, Walton Hall, Milton Keynes MK7 6AA, Bucks, England
[2] Univ Lancaster, Engn Dept, Lancaster LA1 4YR, England
关键词
Octafluorocyclobutane; Plasma deposition; Atomic force microscopy; Wear; Ellipsometry; PLASMA DEPOSITION; FILM; C4F8;
D O I
10.1016/j.polymdegradstab.2018.12.030
中图分类号
O63 [高分子化学(高聚物)];
学科分类号
070305 ; 080501 ; 081704 ;
摘要
Fluoropolymer films are frequently used in microfabrication and for producing hydrophobic and low-k dielectric layers in various applications. As the reliability of functional coatings is becoming a more pressing issue in industry, it is necessary to determine the physical stability and degradation properties of this important class of films. To this end, a study has been undertaken to ascertain the aging characteristics of fluoropolymer films under various environmental conditions that such a film may experience during its use. In particular, fluorocarbon films formed by plasma-enhanced chemical vapour deposition (PECVD) using octafluorocyclobutane, or c-C4F8, as a precursor gas have been exposed to abrasive wear, elevated temperatures, ultraviolet radiation, as well as oxygen plasma and SF6 plasma, the latter being commonly used in conjunction with these films in ion etching processes. The results show that sub-micron thick fluoropolymer films exhibit a significant amount of elastic recovery during nanoscratch tests, minimising the impact of wear. The films exhibit stability when exposed to 365 nm UV light in air, but not 254 nm light in air, which generated significant decreases in thickness. Exposure to temperatures up to 175 degrees C did not generate loss of material, whereas temperatures higher than 175 degrees C did. Etching rates upon exposure to oxygen and SF6 plasmas were also measured. (C) 2019 Elsevier Ltd. All rights reserved.
引用
收藏
页码:203 / 209
页数:7
相关论文
共 30 条
[1]   The study of fluorinated amorphous carbon as low-k dielectric material and its interface with copper metallization [J].
Ariel, N ;
Eizenberg, M ;
Tzou, EY .
LOW-DIELECTRIC CONSTANT MATERIALS V, 1999, 565 :203-208
[2]   Balancing the etching and passivation in time-multiplexed deep dry etching of silicon [J].
Blaw, MA ;
Zijlstra, T ;
van der Drift, E .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2001, 19 (06) :2930-2934
[3]   Selecting suitable image dimensions for scanning probe microscopy [J].
Bowen, James ;
Cheneler, David .
SURFACES AND INTERFACES, 2017, 9 :133-142
[4]   Effects of fluoropolymer addition to an epoxy on scratch depth and recovery [J].
Brostow, W ;
Bujard, B ;
Cassidy, PE ;
Hagg, HE ;
Montemartini, PE .
MATERIALS RESEARCH INNOVATIONS, 2002, 6 (01) :7-12
[5]   Spherical indentation analysis of stress relaxation for thin film viscoelastic materials [J].
Cheneler, David ;
Mehrban, Nazia ;
Bowen, James .
RHEOLOGICA ACTA, 2013, 52 (07) :695-706
[6]   Degradation of polymer films [J].
Cheneler, David ;
Bowen, James .
SOFT MATTER, 2013, 9 (02) :344-358
[7]   Characteristics and durability of fluoropolymer thin films [J].
Cheneler, David ;
Bowen, James ;
Evans, Stephen D. ;
Gorzny, Marcin ;
Adams, Michael J. ;
Ward, Michael C. L. .
POLYMER DEGRADATION AND STABILITY, 2011, 96 (04) :561-565
[8]   Contributions of CF and CF2 Species to Fluorocarbon Film Composition and Properties for CxFy Plasma-Enhanced Chemical Vapor Deposition [J].
Cuddy, Michael F. ;
Fisher, Ellen R. .
ACS APPLIED MATERIALS & INTERFACES, 2012, 4 (03) :1733-1741
[9]   Molecular origins of fluorocarbon hydrophobicity [J].
Dalvi, Vishwanath H. ;
Rossky, Peter J. .
PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA, 2010, 107 (31) :13603-13607
[10]   Fluorinated amorphous carbon as a low-dielectric constant interlayer dielectric [J].
Endo, K .
MRS BULLETIN, 1997, 22 (10) :55-58