New approach for the dynamical simulation of CBED patterns in heavily strained specimens

被引：11

作者：

Houdellier, F. ^{[1
]}

Altibelli, A. ^{[1
]}

Roucau, C. ^{[1
]}

Casanove, Mt ^{[1
]}

机构：

[1] CEMES CNRS, F-31055 Toulouse, France

来源：

ULTRAMICROSCOPY | 2008年 / 108卷 / 05期

关键词：

convergent beam electron diffraction; dynamical theory of electron diffraction; strained layers;

D O I：

10.1016/j.ultramic.2007.06.002

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

A new method for the dynamical simulation of convergent beam electron diffraction (CBED) patterns is proposed. In this method, the three-dimensional stationary Schrodinger equation is replaced by a two-dimensional time-dependent equation, in which the direction of propagation of the electron beam, variable z, stands as a time. We demonstrate that this approach is particularly well-suited for the calculation of the diffracted intensities in the case of a z-dependent crystal potential. The corresponding software has been developed and implemented for simulating CBED patterns of various specimens, from perfect crystals to heavily strained cross-sectional specimens. Evidence is given for the remarkable agreement between simulated and experimental patterns. (c) 2007 Elsevier B.V. All rights reserved.

引用

页码：426 / 432

页数：7

共 25 条

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